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Arvind Raghavan
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2020 – today
- 2024
- [j4]Arvind Raghavan
, Keng Chen
A Fully Integrated 1 GHz 8A Imax Step-Down and Step-Up Switched Capacitor Voltage Regulator in 3 nm FinFET Technology Featuring Auto Mode Transition. IEEE Trans. Circuits Syst. I Regul. Pap. 71(7): 3016-3028 (2024) - 2023
- [c3]Iddo Drori, Sarah J. Zhang, Zad Chin, Reece Shuttleworth, Albert Lu, Linda Chen, Bereket Birbo, Michele He, Pedro Lantigua, Sunny Tran, Gregory Hunter, Bo Feng, Newman Cheng, Roman Wang, Yann Hicke, Saisamrit Surbehera, Arvind Raghavan, Alexander E. Siemenn, Nikhil Singh, Jayson Lynch, Avi Shporer, Nakul Verma, Tonio Buonassisi, Armando Solar-Lezama:
A Dataset for Learning University STEM Courses at Scale and Generating Questions at a Human Level. AAAI 2023: 15921-15929 - [c2]Huanhuan Zhang, Alexander Lyakhov, Arvind Raghavan:
A 4nm FinFET 0.8V 13ppm/°C Switched Capacitor Based Current Mode Bandgap Reference. ESSCIRC 2023: 81-84 - 2022
- [i1]Vitali Petsiuk, Alexander E. Siemenn, Saisamrit Surbehera, Zad Chin, Keith Tyser, Gregory Hunter, Arvind Raghavan, Yann Hicke, Bryan A. Plummer, Ori Kerret, Tonio Buonassisi, Kate Saenko, Armando Solar-Lezama
Human Evaluation of Text-to-Image Models on a Multi-Task Benchmark. CoRR abs/2211.12112 (2022)
2010 – 2019
- 2016
- [j3]William J. Bowhill, Blaine A. Stackhouse, Nevine Nassif, Zibing Yang, Arvind Raghavan, Oscar Mendoza, Charles Morganti, Chris Houghton, Dan Krueger, Olivier Franza, Jayen Desai, Jason Crop, Brian Brock, Dave Bradley, Chris Bostak, Sal Bhimji, Matt Becker:
The Xeon® Processor E5-2600 v3: a 22 nm 18-Core Product Family. IEEE J. Solid State Circuits 51(1): 92-104 (2016) - 2015
- [c1]William J. Bowhill, Blaine A. Stackhouse, Nevine Nassif, Zibing Yang, Arvind Raghavan, Charles Morganti, Chris Houghton, Dan Krueger, Olivier Franza, Jayen Desai, Jason Crop, Dave Bradley, Chris Bostak, Sal Bhimji, Matt Becker:
4.5 The Xeon® processor E5-2600 v3: A 22nm 18-core product family. ISSCC 2015: 1-3 - 2014
- [j2]Roger Piqueras Jover, Joshua Lackey, Arvind Raghavan:
Enhancing the security of LTE networks against jamming attacks. EURASIP J. Inf. Secur. 2014: 7 (2014)
2000 – 2009
- 2003
- [j1]Arvind Raghavan, Sunitha Venkataraman, Bhaskar Banerjee, Youngsuk Suh, Deukhyoun Heo, Joy Laskar:
Direct extraction of an empirical temperature-dependent InGaP/GaAs HBT large-signal model. IEEE J. Solid State Circuits 38(9): 1443-1450 (2003)
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