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Philippe Descamps
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2020 – today
- 2024
- [j9]Aymen Ben Hammadi, Mohamed Aziz Doukkali, Philippe Descamps
, Constant Niamien
A 26-28 GHz, Two-Stage, Low-Noise Amplifier for Fifth-Generation Radio Frequency and Millimeter-Wave Applications. Sensors 24(7): 2237 (2024)
2010 – 2019
- 2019
- [c8]Kassem Hamze
Applied TRL Calibration Method to Differential Devices Embedded in a Test Board. RWS 2019: 1-4 - 2017
- [c7]Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert:
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. IECON 2017: 7969-7973 - 2016
- [c6]Philippe Descamps, Vincent Hilaire, Olivier Lamotte, Sebastian Rodriguez
An Experience of Engineering of MAS for Smart Environments: Extension of ASPECS. IIMSS 2016: 649-658 - 2015
- [j8]Yishuai Lin, Philippe Descamps, Nicolas Gaud, Vincent Hilaire
Multi-Agent System for intelligent Scrum project management. Integr. Comput. Aided Eng. 22(3): 281-296 (2015) - [c5]Samuel Deniaud, Philippe Descamps, Vincent Hilaire
An Analysis and Prototyping Approach for Cyber-Physical Systems. FNC/MobiSPC 2015: 520-525 - 2013
- [c4]Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal:
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings. RWS 2013: 304-306 - [c3]Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal:
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings. WiSNet 2013: 100-102 - 2012
- [c2]Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps:
Performances of RF PA classes in LINC systems. ISCAS 2012: 2179-2182 - [c1]Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps:
Influence of the output harmonic networks of classes F and F-1 power amplifiers in LINC systems. NEWCAS 2012: 477-480
2000 – 2009
- 2008
- [j7]P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier:
Determination of temperature change inside IC packages during laser ablation of molding compound. Microelectron. Reliab. 48(8-9): 1263-1267 (2008) - 2005
- [j6]Dolphin Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès:
Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectron. Reliab. 45(9-11): 1639-1644 (2005) - 2004
- [j5]Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti:
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44(9-11): 1559-1563 (2004) - [j4]F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps:
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. Microelectron. Reliab. 44(9-11): 1799-1804 (2004) - 2003
- [j3]Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina:
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43(9-11): 1809-1814 (2003) - 2002
- [j2]Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42(9-11): 1449-1452 (2002) - [j1]Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali:
Magnetic field measurements for Non Destructive Failure Analysis. Microelectron. Reliab. 42(9-11): 1763-1766 (2002)
Coauthor Index
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