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Nils Heidmann
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2010 – 2019
- 2017
- [j2]Jochen Rust, Nils Heidmann, Steffen Paul:
Approximate computing of two-variable numeric functions using multiplier-less gradients. Microprocess. Microsystems 48: 48-55 (2017) - 2016
- [j1]Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Analysis of aging effects - From transistor to system level. Microelectron. Reliab. 67: 64-73 (2016) - 2015
- [c12]Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Variability-aware aging modeling for reliability analysis of an analog neural measurement system. ETS 2015: 1-6 - [c11]Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits. IRPS 2015: 1 - [c10]Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
An aging-aware transistor sizing tool regarding BTI and HCD degradation modes. MIXDES 2015: 272-277 - [c9]Jochen Rust, Nils Heidmann, Steffen Paul:
Two-variable numeric function approximation using least-squares-based regression. NORCAS 2015: 1-4 - [c8]Nico Hellwege, Nils Heidmann, Steffen Paul, Dagmar Peters-Drolshagen:
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity. SBCCI 2015: 14:1-14:7 - 2014
- [c7]Nils Heidmann, Nico Hellwege, Tim Hohlein, Thomas Westphal, Dagmar Peters-Drolshagen, Steffen Paul:
Modeling of an analog recording system design for ECoG and AP signals. DATE 2014: 1-6 - [c6]Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul:
Analog behavioral modeling for age-dependent degradation of complex analog circuits. MIXDES 2014: 317-322 - [c5]Nasim Pour Aryan, Nils Heidmann, Martin Wirnshofer, Nico Hellwege, Jonas Pistor, Dagmar Peters-Drolshagen, Georg Georgakos, Steffen Paul, Doris Schmitt-Landsiedel:
Power efficient digital IC design for a medical application with high reliability requirements. PATMOS 2014: 1-5 - 2013
- [c4]Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Reliability analysis for integrated circuit amplifiers used in neural measurement systems. DATE 2013: 713-716 - [c3]Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Variability-aware gradual aging for generating reliability figures of a neural measurement system. MIXDES 2013: 380-385 - 2011
- [c2]Nils Heidmann, Till Wiegand, Steffen Paul:
Architecture and FPGA-implementation of a high throughput K+-Best detector. DATE 2011: 240-245 - [c1]Till Wiegand, Nils Heidmann, Steffen Paul:
Modified Partial Euclidean Distance for iterative tree-search MIMO detection. PIMRC 2011: 1723-1727
Coauthor Index
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