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Pawel Janus
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2020 – today
- 2020
- [c5]Pawel Pienczuk, Cezary Kolacinski, Andrzej Szymanski, Pawel Janus, Krzysztof Kucharski, Dariusz Obrebski, Michal Zbiec, Mariusz Jakubowski:
Multichannel Programmable Readout IC for Photodiodes Array. MIXDES 2020: 112-116
2010 – 2019
- 2018
- [c4]Mariusz Zubert
, Tomasz Raszkowski, Jedrzej Topilko, Lukasz Starzak
Determining Parameters of the Dual-Phase-Lag Model of Heat Flow. MIXDES 2018: 225-230 - 2017
- [c3]Pawel Janus, Krzysztof Rzadca:
SLO-aware colocation of data center tasks based on instantaneous processor requirements. SoCC 2017: 256-268 - [i1]Pawel Janus, Krzysztof Rzadca:
SLO-aware Colocation of Data Center Tasks Based on Instantaneous Processor Requirements. CoRR abs/1709.01384 (2017) - 2016
- [c2]Francesco Ivaldi
New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout. ESSDERC 2016: 444-447 - 2013
- [c1]Tomasz Bieniek, Grzegorz Janczyk, Rafal Dobrowolski, Dariusz Szmigiel, Magdalena Ekwinska, Piotr Grabiec, Pawel Janus, Jerzy Zajac:
Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation. 3DIC 2013: 1-6 - 2012
- [j5]R. F. Szeloch, Pawel Janus, Jaroslaw Serafinczuk
Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform. Microelectron. Reliab. 52(4): 711-717 (2012) - 2011
- [j4]Lukasz Dowhan, Artur Wymyslowski, Pawel Janus, Magdalena Ekwinska, Olaf Wittler:
Extraction of elastic-plastic material properties of thin films through nanoindentaion technique with support of numerical methods. Microelectron. Reliab. 51(6): 1046-1053 (2011) - [j3]Stanislaw Kalicinski, Tomasz Bieniek, Pawel Janus, Piotr Grabiec:
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurements. Microelectron. Reliab. 51(7): 1192-1197 (2011) - [j2]Lukasz Dowhan, Artur Wymyslowski, Stanislaw Kalicinski, Pawel Janus:
Numerical prototyping methods in microsystem accelerometers design. Microelectron. Reliab. 51(7): 1276-1282 (2011)
2000 – 2009
- 2002
- [j1]R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus:
Scanning Thermal Microscopy in Microsystem Reliability Analysis. Microelectron. Reliab. 42(9-11): 1719-1722 (2002)
Coauthor Index
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