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Pattern Recognition, Volume 10
Volume 10, Number 1, 1978
- Pratap N. Misra, S. G. Wheeler:
Crop classification with LANDSAT multispectral scanner data. 1-13 - C. V. Kameswara Rao:
On fingerprint pattern recognition. 15-18 - Daniel Coulon, Daniel Kayser:
Learning criterion and inductive behaviour. 19-25 - Ryuzo Takiyama:
Multiple threshold perceptron. 27-30 - Alexander Keewatin Dewdney:
Analysis of a steepest-descent image-matching algorithm. 31-39 - Balakrishnan Dasarathy, Lee J. White:
A characterization of nearest-neighbor rule decision surfaces and a new approach to generate them. 41-46 - John C. Turner, Chris P. Tsokos
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A nonparametric classification scheme with mean squared error criterion. 47-53
Volume 10, Number 2, 1978
- G. H. Landeweerd, Edzard S. Gelsema:
The use of nuclear texture parameters in the automatic analysis of leukocytes. 57-61 - J. P. Maroy, Marc Berthod:
Natural language understanding by a robot: A pattern recognition problem. 63-71 - Silvano Rivoira, Pietro Torasso:
An isolated-word recognizer based on grammar-controlled classification processes. 73-84 - Anil K. Jain, Richard C. Dubes:
Feature definition in pattern recognition with small sample size. 85-97 - Gerard Gaillat:
A simple learning decision algorithm for character recognition and pattern classification. 99-104 - K. Chidananda Gowda, G. Krishna:
Agglomerative clustering using the concept of mutual nearest neighbourhood. 105-112 - Chris P. Tsokos
Bayes discrimination with mean square error loss. 113-123
Volume 10, Number 3, 1978
- Robert M. Haralick:
Editorial. 127-128 - Stephen D. Shapiro:
Feature space transforms for curve detection. 129-143 - Sahibsingh A. Dudani, Anthony L. Luk:
Locating straight-line edge segments on outdoor scenes. 145-157 - Herbert Freeman:
Shape description via the use of critical points. 159-166 - Harry Blum, Roger N. Nagel:
Shape description using weighted symmetric axis features. 167-180 - Azriel Rosenfeld:
Iterative methods in image analysis. 181-187 - Godfried T. Toussaint:
The use of context in pattern recognition. 189-204 - Owen Robert Mitchell, S. G. Carlton:
Image segmentation using a local extrema texture measure. 205-210 - Ned Glick:
Additive estimators for probabilities of correct classification. 211-222 - Robert M. Haralick:
Structural pattern recognition, homomorphisms, and arrangements. 223-236
Volume 10, Number 4, 1978
- Kazumasa Ozawa:
Simulation of the optical illusions using a spatial filter. 237-242 - Gift Siromoney, R. Chandrasekaran, M. Chandrasekaran:
Computer recognition of printed Tamil characters. 243-247 - Monique Pavel:
A unified setting for projections in pattern recognition. 249-254 - Ryuzo Takiyama:
A general method for training the committee machine. 255-259 - Chi Hau Chen:
Note on a modified gradient method for image analysis. 261-264 - K. C. Varghese, J. Hywel Williams, Denis R. Towill:
Computer aided feature selection for enhanced analogue system fault location. 265-280 - Peter J. van Otterloo, Ian T. Young:
A distribution-free geometric upper bound for the probability of error of a minimum distance classifier. 281-286 - Margareta Holgersson:
The limited value of cophenetic correlation as a clustering criterion. 287-295 - Pierre A. Devijver:
A note on ties in voting with the k-NN rule. 297-298
Volume 10, Number 5-6, 1978
- Leon D. Harmon, S. C. Kuo, P. F. Ramig, U. Raudkivi:
Identification of human face profiles by computer. 301-312 - Linda G. Shapiro:
Inexact matching of line drawings in a syntactic pattern recognition system. 313-321 - Matthew Witten:
Compactification of information in r-color 2-dimensional rectangular patterns. 323-326 - Abe R. Shliferstein, Y. T. Chien:
Switching components and the ambiguity problem in the reconstruction of pictures from their projections. 327-340 - Mabo Robert Ito, T. L. Chui:
On-line computer recognition of proposed standard ANSI(USASI) handprinted characters. 341-349 - G. Leboucher, Gabriel E. Lowitz:
What a histogram can really tell the classifier. 351-357 - Gabriel E. Lowitz:
Stability and dimensionality of Karhunen-Loeve multispectral image expansions. 359-363 - Anil K. Jain, W. G. Waller:
On the optimal number of features in the classification of multivariate Gaussian data. 365-374 - Alberto Apostolico, Eduardo R. Caianiello, Enrico Fischetti
C-calculus: An elementary approach to some problems in pattern recognition . 375-387 - Alberto Apostolico, Eduardo R. Caianiello, Enrico Fischetti
An application of C-calculus to texture analysis: C-transforms. 389-396 - Devendra Sahal:
SELF: A framework for generation of patterns. 397-401
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