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ITC 1999: Atlantic City, NJ, USA
- Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. IEEE Computer Society 1999, ISBN 0-7803-5753-1
Session 2: Mcm and Known-Good-Die Testing
- David R. Lakin II, Adit D. Singh:
Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. 23-30 - Bruce C. Kim, Pinshan Jiang, Se Hyun Park:
A probe scheduling algorithm for MCM substrates. 31-37 - Alfredo Benso, Silvia Chiusano, Paolo Prinetto, Simone Giovannetti, Riccardo Mariani, Silvano Motto:
Testing an MCM for high-energy physics experiments: a case study. 38-46
Session 3: Dynamic Current Testing
- Bram Kruseman, Peter Janssen, Victor Zieren:
Transient current testing of 0.25 μm CMOS devices. 47-56 - Wanli Jiang, Bapiraju Vinnakota:
Statistical threshold formulation for dynamic I_dd test. 57-66 - Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali:
Defect detection using power supply transient signal analysis. 67-76
Session 4: Low Power And Diagnosis In Bist
- Stefan Gerstendörfer, Hans-Joachim Wunderlich:
Minimized power consumption for scan-based BIST. 77-84 - Seongmoon Wang, Sandeep K. Gupta:
LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. 85-94 - Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. Touba:
Fault diagnosis in scan-based BIST using both time and space information. 95-102
Session 5: Volume Production Testing
- Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala:
Expediting ramp-to-volume production. 103-112 - Andrew C. Evans:
Applications of semiconductor test economics, and multisite testing to lower cost of test. 113-123 - Norma Barrett, Simon Martin, Chryssa Dislis:
Test process optimization: closing the gap in the defect spectrum. 124-129
Session 6: Microprocessor Testing
- Timothy J. Wood:
The test and debug features of the AMD-K7 microprocessor. 130-136 - Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar:
DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. 137-146 - Anjali Kinra:
Towards reducing "functional only" fails for the UltraSPARC microprocessors. 147-154
Session 7: Board Test - Lecture Series
- Stephen F. Scheiber:
Breaking the complexity spiral in board test. 155-158 - Adam W. Ley:
The integration of boundary-scan test methods to a mixed-signal environment. 159-162 - Thomas A. Ziaja:
Using LSSD to test modules at the board level. 163-170
Session 8: Delay Testing
- Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer:
Switch-level delay test. 171-180 - Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng:
Delay testing considering power supply noise effects. 181-190 - Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer:
Test generation for crosstalk-induced delay in integrated circuits. 191-200 - Spyros Tragoudas:
Accurate path delay fault coverage is feasible. 201-210
Session 9: Analog Test Methods
- Clifford B. Cole, Thomas P. Warwick:
High speed digital transceivers: A challenge for manufacturing. 211-215 - Dino Ren Tao:
A new approach to RF impedance test. 216-220 - Jeongjin Roh, Jacob A. Abraham:
Subband filtering scheme for analog and mixed-signal circuit testing. 221-229 - Abdelhakim Khouas, Anne Derieux:
Speed-up of high accuracy analog test stimulus optimization. 230-236
Session 10: Virtual And Real Test Software
- J. J. O. Riordan:
Design of a test simulation environment for test program development. 237-244 - Mitsuo Matsumoto, Yoshiharu Ikeda:
Automatic timing margin failure location analysis by CycleStretch method. 245-251 - David A. Bonnett:
Design for In-System Programming. 252-259
Session 11: DFT
- Ramesh C. Tekumalla, Premachandran R. Menon:
Robust testability of primitive faults using test points. 260-268 - Eric W. MacDonald, Nur A. Touba:
Delay testing of SOI circuits: Challenges with the history effect. 269-275 - Mansour Shashaani, Manoj Sachdev:
A DFT technique for high performance circuit testing. 276-285 - Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. 286-293
Session 12: Embedded Memories
- Jeff Rearick:
Practical scan test generation and application for embedded FIFOs. 294-300 - Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani:
Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. 301-310 - Dilip K. Bhavsar:
An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264. 311-318
Session 13: Mems Fault Modeling and Test
- Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. 319-328 - Tao Jiang, Ronald D. Blanton:
Particulate failures for surface-micromachined MEMS. 329-337 - Richard W. Beegle, Robert W. Brocato, Ronald W. Grant:
IMEMS accelerometer testing-test laboratory development and usage. 338-347
Session 14: Industrial Applications of BIST
- Michinobu Nakao, Seiji Kobayashi, Kazumi Hatayama, Kazuhiko Iijima, Seiji Terada:
Low overhead test point insertion for scan-based BIST. 348-357 - Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski:
Logic BIST for large industrial designs: real issues and case studies. 358-367 - Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
Synthesis of pattern generators based on cellular automata with phase shifters. 368-377
Session 15: Production Wafer Test: Where the Probes Meet the Pads
- Minh Quach, Rich Samuelson, David Shaw:
Characterization and optimization of the production probing process. 378-387 - Dean A. Gahagan:
RF (gigahertz) ATE production testing on wafer: options and tradeoffs. 388-395 - Jerry J. Broz, Reynaldo M. Rincon:
Probe contact resistance variations during elevated temperature wafer test. 396-405
Session 16: Design Validation and Analysis for Evolving Technologies
- Sezer Gören, F. Joel Ferguson:
Checking sequence generation for asynchronous sequential elements. 406-413 - Manfred Stadler, Thomas Röwer, Hubert Kaeslin, Norbert Felber, Wolfgang Fichtner, Markus Thalmann:
Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor. 414-420 - Kyung Tek Lee, Jacob A. Abraham:
Critical path identification and delay tests of dynamic circuits. 421-430
Session 17: Board Test: Interconnect Test
- Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras:
An embedded technique for at-speed interconnect testing. 431-438 - Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing. 439-448 - Yuejian Wu, Paul Soong:
Interconnect delay fault testing with IEEE 1149.1. 449-457
Session 18: Enhanced Test and Diagnosis of IC Process Defects
- Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith:
Correlation of logical failures to a suspect process step. 458-476 - Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq:
Optimal conditions for Boolean and current detection of floating gate faults. 477-486
Session 19: Embedded Core Test
- Luis Basto, Asif Khan, Pete Hodakievic:
Embedded X86 testing methodology. 487-492 - Peter Harrod:
Testing reusable IP-a case study. 493-498 - Rochit Rajsuman:
Testing a system-on-a-chip with embedded microprocessor. 499-508
Session 20: Issues in Tester Accuracy
- Yi Cai, William R. Ortner, C. T. Garrenton:
Towards a standardized procedure for automatic test equipment timing accuracy evaluation. 509-517 - Wajih Dalal, Song Miao:
The value of tester accuracy. 518-523 - Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner:
An accurate simulation model of the ATE test environment for very high speed devices. 524-531
Session 21: Mixed Signal BIST Techniques
- Stephen K. Sunter, Aubin Roy:
BIST for phase-locked loops in digital applications. 532-540 - Benoit Provost, Edgar Sánchez-Sinencio:
Auto-calibrating analog timer for on-chip testing. 541-548 - Gloria Huertas, Diego Vázquez, Adoración Rueda, José L. Huertas:
Effective oscillation-based test for application to a DTMF filter bank. 549-555
Session 22: Board Test: Practice Makes Perfect
- Frans G. M. de Jong, Rob Raaijmakers:
Static component interconnection test technology in practice. 556-565 - David Rahe:
The HASS development process. 566-576 - Cherif Ahrikencheikh, Michael Spears:
Limited access testing of analog circuits: handling tolerances. 577-586
Session 23: Fault Simulation from Bridges to RTL
- R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma:
A comparison of bridging fault simulation methods. 587-595 - Vijay R. Sar-Dessai, D. M. H. Walker:
Resistive bridge fault modeling, simulation and test generation. 596-605 - Sitaran Yadavalli, Sudhakar M. Reddy:
SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level. 606-615
Session 24: Practicing Embedded Core Test
- Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel:
Towards a standard for embedded core test: an example. 616-627 - Robert C. Aitken, Fidel Muradali:
Trends in SLI design and their effect on test. 628-637 - Jos van Beers, Harry Van Herten:
Test features of a core-based co-processor array for video applications. 638-647 - Bozena Kaminska:
Is Analog Fault Simulation a Key to Product Quality? Practical Considerations. 648
Session 25: (Panel) Is Analog Fault Simulation a Key to Product Quality? Practical Considerations
- Eugene R. Atwood:
Analog Fault Simulation: Need it? No. It is already done. 649 - Craig Force:
Analog Fault Simulation: Key to Product Quality, or a Foot in the Door. 650 - Hosam Haggag:
Closing The Gap Between Process Development and Mixed Signal Design and Testing. 651
Session 26: On-Line Testing Techniques
- Cecilia Metra, Flavio Giovanelli, Mani Soma, Bruno Riccò:
Self-checking scheme for very fast clocks' skew correction. 652-661 - Subhasish Mitra
, Nirmal R. Saxena, Edward J. McCluskey:
A design diversity metric and reliability analysis for redundant systems. 662-671 - Chaohuang Zeng, Nirmal R. Saxena, Edward J. McCluskey:
Finite state machine synthesis with concurrent error detection. 672-679
Session 27: System Test - Lecture Series
- Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren:
The evolution of a system test process [for Motorola GSM products]. 680-688 - Susana Stoica:
System design verification tests - an overview. 689-697 - David Williams:
PC manufacturing test in a high volume environment. 698-704 - Gordon D. Robinson:
DFT, test lifecycles and the product lifecycle. 705-713
Session 28: Production I - Testing Beyond Single-Threshold Measurements
- Claude Thibeault:
An histogram based procedure for current testing of active defects. 714-723 - Anthony C. Miller:
IDDQ testing in deep submicron integrated circuits. 724-729 - Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana:
Clustering based techniques for I_DDQ testing. 730-737 - Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman:
Current ratios: a self-scaling technique for production I_DDQ testing. 738-746
Session 29: Testing Analog to Digital Converters
- Turker Kuyel:
Linearity testing issues of analog to digital converters. 747-756 - Nico Csizmadia, Augustus J. E. M. Janssen:
Estimating the integral non-linearity of A/D-converters via the frequency domain. 757-762 - Solomon Max:
Testing high speed high accuracy analog to digital converters embedded in systems on a chip. 763-771 - Turker Kuyel, Haydar Bilhan:
Relating linearity test results to design flaws of pipelined analog to digital converters. 772-779
Session 30: Issues in High-Speed Testing
- Burnell G. West:
Accuracy requirements in at-speed functional test. 780-787 - Mike P. Li, Jan B. Wilstrup, Ross Jessen, Dennis Petrich:
A new method for jitter decomposition through its distribution tail fitting. 788-794 - Burnell G. West:
At-speed structural test. 795-800 - David C. Keezer
Test support processors for enhanced testability of high performance circuits. 801-809
Session 31: Test Methodology State of Practice and Case Studies
- Magdy S. Abadir, Rajesh Raina:
Design-for-test methodology for Motorola PowerPC microprocessors. 810-819 - M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor:
Testability of the Philips 80C51 micro-controller. 820-829 - Li-C. Wang, Magdy S. Abadir:
Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. 830-838 - Kenneth M. Butler:
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. 839-847
Session 32: System Test Methods from DFT to End of Live
- Susana Stoica:
Robust test methods applied to functional design verification. 848-857 - Sandhya Seshadri, Michael S. Hsiao:
An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques. 858-867 - Lee A. Shombert, Danny C. Davis, Eric M. Bukata:
The test requirements model (TeRM) communicating test information throughout the product life cycle. 868-876
Session 33: Design for Diagnostics
- Richard H. Livengood, Donna Medeiros:
Design for (physical) debug for silicon microsurgery and probing of flip-chip packaged integrated circuits. 877-882 - William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky:
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). 883-891 - Gert-Jan van Rootselaar, Bart Vermeulen:
Silicon debug: scan chains alone are not enough. 892-902
Session 34: Test Synthesis
- Han Bin Kim, Dong Sam Ha:
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming. 903-912 - Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors. 913-922 - Irith Pomeranz, Sudhakar M. Reddy:
On achieving complete coverage of delay faults in full scan circuits using locally available lines. 923-931
Session 35: Mixed-Signal ATE Issues and Optical Probing
- Keneth R. Wilsher, William K. Lo:
Practical optical waveform probing of flip-chip CMOS devices. 932-939 - Tagashi Kitagaki:
Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]. 940-946 - Koji Asami, Shinsuke Tajiri:
A method to improve the performance of high-speed waveform digitizing. 947-954
Session 36: On-Line Testing for FPGAS and Processors
- Sudip Chakrabarti, Abhijit Chatterjee:
On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. 955-963 - Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch:
An efficient on-line-test and back-up scheme for embedded processors. 964-972 - Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma:
Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. 973-982
Session 37: Memory Testing
- Ad J. van de Goor, Ivo Schanstra:
Industrial evaluation of stress combinations for march tests applied to SRAMs. 983-992 - Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
An on-line BISTed SRAM IP core. 993-1000 - Said Hamdioui, Ad J. van de Goor:
Port interference faults in two-port memories. 1001-1010
Session 38: Test Generation
- Peter Wohl, John A. Waicukauski:
Using Verilog simulation libraries for ATPG. 1011-1020 - Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska:
STAR-ATPG: a high speed test pattern generator for large scan designs. 1021-1030 - Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer:
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. 1031-1037
Session 39: Advanced Solution for SOC Test
- Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian:
HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs. 1038-1044 - HyungWon Kim, John P. Hayes:
Delay fault testing of IP-based designs via symbolic path modeling. 1045-1054 - Lee Whetsel:
Addressable test ports an approach to testing embedded cores. 1055-1064
Session 40: Applying Diagnosis in a Production Test Environment
- David B. Lavo, Tracy Larrabee, Jonathon E. Colburn:
Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. 1065-1072 - Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus:
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor. 1073-1082 - Yun Shao, Ruifeng Guo
The effects of test compaction on fault diagnosis. 1083-1089
Session 41: Time-to-Market - Lecture Series
- Jim Johnson:
Is DFT right for you? 1090-1097 - Jon Turino:
Design for test and time to market-friends or foes. 1098-1101 - Bulent I. Dervisoglu:
Design for testability: it is time to deliver it for Time-to-Market. 1102-1111 - Mahesh A. Iyer:
High Time For High Level ATPG. 1112
Panel 1: High Time for High-Level ATPG
- Wu-Tung Cheng:
High time for high level ATPG. 1113 - Scott Davidson:
Changing our Path to High Level ATPG. 1114 - Rohit Kapur:
High level ATPG is important and is on its way! 1115-1116 - Christos A. Papachristou:
High Time for Higher Level BIST. 1117 - Matteo Sonza Reorda:
High-level ATPG: a real topic or an academic amusement? 1118 - Wolfgang Roethig:
High-level ATPG for Early Power Analysis. 1119-1120 - Keith Baker:
SIA Roadmaps: Sunset Boulevard for l_DDQ. 1121 - Jeffrey L. Roehr:
Thin Gate Oxide Reliability. 1122
Panel 4: Thin Gate Oxide Reliability
- E. James Prendergast:
Applying lessons learned from TDDB testing. 1123-1124 - Scott Davidson:
ITC'99 Benchmark Circuits - Preliminary Results. 1125
Panel 6: ITC'99 Benchmark Circuits - Preliminary Results
- Chouki Aktouf:
Scan Insertion at the Behavioral Level. 1126 - Mario Konijnenburg, Hans van der Linden, Jeroen Geuzebroek:
Benchmarking DAT with the ITC'99 ATPG Benchmarks. 1127 - Sudhakar M. Reddy:
Application of Tools Developed at the University of Iowa to ITC Benchmarks. 1128 - Jean François Santucci, Christophe Paoli:
High level test bench generation using software engineering concepts. 1129 - Raghuram S. Tapuri:
Automatic Functional Test Generation - A Reality. 1130 - Vishwani D. Agrawal:
Panel: Increasing test coverage in a VLSI desgin course. ITC 1999: 1131
Panel 7: Increasing Test Coverage in VLSI Design
- Jacob A. Abraham:
Position Statement: Increasing Test Coverage in a VLSI Design Course. 1132 - Michael L. Bushnell:
Increasing Test Coverage in a VLSI Design Course. 1133 - John Harrington:
VLSI design 101 - The test module. 1134 - Michel Robert:
Increasing test coverage in a VLSI design course. 1135 - Mani Soma:
Panel Statement: Increasing test coverage in a VLSI design course. 1136 - Wayne H. Wolf:
Position Statement: Testing in a VLSI Design Course. 1137 - Frans G. M. de Jong:
SCITT: Back to Basics in Mass Production Testing. 1138
Panel 8: SCITT: Back to Basics in Mass Production Testing
- Frank W. Angelotti:
SCITT: Bringing DRAMs Into the Test Fold. 1139 - Steffen Hellmold:
Static Component Interconnection Test Technology (SCITT). 1140 - David M. Wu:
DFT is all I can afford, who cares about Design for Yield or Design for Reliability! 1141-1142
Panel 9: DIFT is all I Can Afford, Who Vares About Design for Yield or Design for Reliability!
- Robert C. Aitken:
It Makes Sense to Combine DFT and DFR/DFY. 1143 - R. Scott Fetherston:
DFT, DFY, DFR: Who Cares? 1144 - James A. Monzel:
DFT, DFY, and DFR; Which One(s) Do You Worry About? 1145 - D. M. H. Walker:
Design for Yield and Reliability is MORE Important Than DFT. 1146 - David M. Wu:
"DFY and DFR are more important than DFT". 1147 - Peter Wohl:
Output in still, input in still. 1148
Panel 10: Output in STIL, Input in STIL
- Nathan Biggs:
STIL: the device-oriented database for the test development lifecycle. 1149 - Brion L. Keller:
Using STIL to describe embedded core test requirements. 1150 - Marc Loranger:
Is there a STIL for mixed signal testing? 1151
ITC'98 Best Paper
- Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong:
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. 1152-1161
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