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MTDT 2004: San José, CA, USA
- 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. IEEE Computer Society 2004, ISBN 0-7695-2193-2
Session 2: Fast ECC and Efficient Cache Controllers
- Elaine Ou, Woodward Yang:
Fast Error-Correcting Circuits for Fault-Tolerant Memory. 8-12 - Adil Akaaboune, Nazeih Botros, Jaafar Alghazo:
Tag Skipping Technique Using WTS Buffer for Optimal Low Power Cache Design. 13-18 - Jaafar Alghazo, Adil Akaaboune, Nazeih Botros:
SF-LRU Cache Replacement Algorithm. 19-24
Session 3: Memory Fault Coverage and Test Analysis
- Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars:
The Effectiveness of the Scan Test and Its New Variants. 26-31 - Zaid Al-Ars, Martin Herzog, Ivo Schanstra, Ad J. van de Goor:
Influence of Bit Line Twisting on the Faulty Behavior of DRAMs. 32-37 - Luca Schiano, Marco Ottavi, Fabrizio Lombardi:
Markov Models of Fault-Tolerant Memory Systems under SEU. 38-43
Session 4: Special Session
- Bruce F. Cockburn:
Tutorial on Magnetic Tunnel Junction Magnetoresistive Random-Access Memory. 46-51
Session 5: Embedded Memory Test Trends and Future
- Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor:
The State-of-Art and Future Trends in Testing Embedded Memories. 54-59 - Shyue-Kung Lu, Shih-Chang Huang:
Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. 60-64 - Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu:
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. 65-69
Session 6: Industrial Practices on BIST, BISD and BISR
- Rita Zappa, Carolina Selva, Danilo Rimondi, Cosimo Torelli, M. Crestan, Giovanni Mastrodomenico, Lara Albani:
Micro Programmable Built-In Self Repair for SRAMs. 72-77 - Swapnil Bahl:
A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. 78-83 - Carolina Selva, Cosimo Torelli, Danilo Rimondi, Rita Zappa, Stefano Corbani, Giovanni Mastrodomenico, Lara Albani:
A Programmable Built-in Self-Diagnosis for Embedded SRAM. 84-89
Session 7: EDA Solutions to Test and Repair Memories
- R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald:
An Integrated Memory Self Test and EDA Solution. 92-95 - Saman Adham, Benoit Nadeau-Dostie:
A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs. 98-101
Session 8: Making Memories More Reliable
- N. Derhacobian, Valery A. Vardanian, Yervant Zorian:
Embedded Memory Reliability: The SER Challenge. 104-110 - Michael Spica, T. M. Mak:
Do We Need Anything More Than Single Bit Error Correction (ECC)? 111-116 - Robert C. Aitken:
Redundancy & It's Not Just for Defects Anymore. 117-120
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