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Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique / Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN ; Rutherford) et al.
SRAM-based field-programmable gate array (FPGA) vendors typically integrate error correction codes (ECCs) into the configuration memory to assist designers in implementing scrubbing mechanisms. In most cases, these ECC schemes guarantee the correction of single- and double-bit errors per configuration frame but fail to correct upsets with higher multiplicity in a single frame caused by a single event. [...]
2022 - 12 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 871-882

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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions / Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Vrachnis, John (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Segkos, Nikolaos (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Polo, Cesar Boatella (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) et al.
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. [...]
2021 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 68 (2021) 36-45

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2	Sari, A
1	Sari, A.

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