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CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
/ Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Costantino, Alessandra (ESTEC, Noordwijk) ; Coronetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew Alexander (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Johnson, Eliott Philippe (CERN) et al.
We present the progress related to CERN’s capacity of delivering highly penetrating, high-linear energy transfer (LET) heavy ions for radiation effect testing of electronic components within the CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations, and a 300- $\mu $ m-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1549-1556
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
/ Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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Assessment of the Quirónsalud Proton Therapy Centre Accelerator for Single Event Effects Testing
/ Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Alía, Rubén García (CERN) ; Sanchez, Juan Antonio Vera ; Mazal, Alejandro
High-energy proton testing is used for single-event effect (SEE) qualification of electronics employed in several radiation-harsh environments. Given the increasing demand, exploiting the capabilities of proton therapy centers for electronics testing may become desirable. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1571-1579
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LET Calibration of Ion Microbeams and Their SEE Cross Section Characterization
/ Peracchi, Stefania (ANSTO, Menai) ; Drury, Ryan (ANSTO, Menai) ; Pastuovic, Zeljko (ANSTO, Menai) ; Williams, Jesse (Wollongong U.) ; Tran, Linh T (Wollongong U.) ; Guatelli, Susanna (Wollongong U.) ; Pan, Vladimir (Wollongong U.) ; Archer, Jay W (Wollongong U.) ; Rosenfeld, Anatoly B (Wollongong U.) ; Coronetti, Andrea (CERN) et al.
The Australian Nuclear Science and Technology Organisation hosts the Center for Accelerator Science, a sovereign facility with light and heavy ion beams. The 10-MV ANTARES accelerator is equipped with one of the few heavy ion nuclear microprobes in the world, which has been upgraded with the unique external beam irradiation facility (EBIF). [...]
2024 - 6 p.
- Published in : IEEE Trans. Nucl. Sci.
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1565-1570
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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Beam optics modelling of slow-extracted very high-energy heavy ions from the CERN Proton Synchrotron for radiation effects testing
/ Johnson, Eliott (CERN) ; Bilko, Kacper (CERN) ; Delrieux, Marc (CERN) ; Esposito, Luigi Salvatore (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew (CERN) ; Garcia Alia, Ruben (CERN) ; Arrutia Sota, Pablo Andreas (CERN) ; Waets, Andreas (CERN)
Testing of space-bound microelectronics plays a crucial role in ensuring the reliability of electronics exposed to the challenging radiation environment of outer space. This contribution describes the beam optics studies carried out for the run held in November 2023 in the context of the CERN High-Energy Accelerators for Radiation Testing and Shielding (HEARTS) experiment. [...]
2024 - 4 p.
- Published in : JACoW IPAC 2024 (2024) THPR30
Fulltext: PDF;
In : 15th International Particle Accelerator Conference (IPAC 2024), Nashville, TN, United States, 19 - 24 May 2024, pp.THPR30
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN
/ Lerner, Giuseppe (CERN) ; Pelissou, Pierre (CERN ; INSA, Toulouse) ; Aguiar, Ygor Q (CERN) ; Sacristan Barbero, Mario (CERN) ; Cecchetto, Matteo (CERN) ; Biłko, Kacper (CERN) ; Coussen, Louise (CERN ; INSA, Toulouse) ; Emriskova, Natalia (CERN) ; García Alía, Rubén (CERN) ; Dyks, Luke (CERN ; Oxford U.) et al.
The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced single-event effects (SEEs) in electronic devices. In this work, we study a setup where the 200-MeV electron beam of the CLEAR accelerator at European Organization for Nuclear Research [Centre Européen pour la Recherche Nucléaire (CERN)] is directed on an aluminum target to produce a radiation field with a large neutron component. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1572-1579
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Fragmented High-Energy Heavy-Ion Beams for Electronics Testing
/ García Alía, Rubén (CERN) ; Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; Cerutti, Francesco (CERN) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Pujol, Francesc Salvat (CERN) ; Waets, Andreas (CERN ; U. Zurich (main)) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Saigné, Frédéric (IES, Montpellier) et al.
Fragmented heavy-ion beams obtained from the
interaction of highly energetic ions with thick targets relative
to the ion ranges are proposed to mimic the high-penetration
linear energy transfer (LET) spectrum present in space and
for electronics testing. Our experimental data characterizing
fragmented heavy-ion beams show an excellent level of agreement
with the Monte Carlo simulations, serving as an initial proofof-concept of the proposed single-event effect (SEE) testing
approach..
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 70 (2023) 486-495
Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.486-495
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