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Article
Title Magnetic Field Penetration of Niobium Thin Films Produced by the ARIES Collaboration
Author(s) Turner, Daniel (Cockcroft Inst. Accel. Sci. Tech. ; Lancaster U. (main)) ; Burt, Graeme (Cockcroft Inst. Accel. Sci. Tech. ; Lancaster U. (main)) ; Chyhyrynets, Eduard (INFN, Legnaro) ; Dumbell, Keith (Cockcroft Inst. Accel. Sci. Tech. ; Daresbury) ; Junginger, Tobias (TRIUMF ; U. Victoria (main)) ; Leith, Stewart (U. Siegen (main)) ; Malyshev, Oleg (Daresbury ; Cockcroft Inst. Accel. Sci. Tech.) ; Medvids, Arturs (Riga Tech. U.) ; Onufrijevs, Pavels (Riga Tech. U.) ; Pira, Cristian (INFN, Legnaro) ; Ries, Rastislav (Bratislava, Electrotech. Inst.) ; Seiler, Eugen (Bratislava, Electrotech. Inst.) ; Sublet, Alban (CERN) ; Valizadeh, Reza (Daresbury ; Cockcroft Inst. Accel. Sci. Tech.) ; Vogel, Michael (U. Siegen (main)) ; Wilson, James (Daresbury)
Publication 2022
Number of pages 5
In: JACoW SRF 2021 (2022) 77-81
In: 20th International Conference on RF Superconductivity (SRF 2021), Online, US, 28 Jun - 2 Jul 2021, pp.77-81
DOI 10.18429/JACoW-SRF2021-SUPFDV007
Subject category Accelerators and Storage Rings
Abstract Superconducting (SC) thin film coatings on Cu substrates are already widely used as an alternative to bulk Nb SRF structures. Using Cu allows improved thermal stability compared to Nb due to having a greater thermal conductivity. Niobium thin film coatings also reduce the amount of Nb required to produce a cavity. The performance of thin film Nb cavities is not as good as bulk Nb cavities. The H2020 ARIES WP15 collaboration studied the impact of substrate polishing and the effect produced on Nb thin film depositions. Multiple samples were produced from Cu and polished with various techniques. The polished Cu substrates were then coated with a Nb film at partner institutions. These samples were characterised with surface characterisation techniques for film morphology and structure. The SC properties were studied with 2 DC techniques, a vibrating sample magnetometer (VSM) and a magnetic field penetration (MFP) facility. The results conclude that both chemical polishing and electropolishing produce the best DC properties in the MFP facility. A comparison between the VSM and the MFP facility can be made for 10 $\mu$m thick samples, but not for 3 $\mu$m thick samples.
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