| Article | |
| Title | Ge Migration Effect of $Si/Ge_{n}/Si(100)$ Heterostructure Films Probed by Grazing Incidence Fluorescence X-Ray Absorption Fine Structure |
| Author(s) | Pan, Zhiyun ; Oyanagi, Hiroyuki ; Sun, Zhihu ; Xie, Zhi ; Fan, Jiangwei ; Wei, Shiqiang |
| Publication | 2007 |
| In: | AIP Conf. Proc. 882 (2007) pp.559-562 |
| In: | 13th International Conference on X-ray Absorption Fine Structure, Stanford, CA, USA, 9 - 14 Jul 2006, pp.559-562 |
Zapis kreiran 2007-06-08, zadnja izmjena 2007-09-11
External link:
Published version from AIP
Published version from AIP