Measurement and interpretation of same-sign $W$ boson pair production in association with two jets in $pp$ collisions at $\sqrt{s} = 13$ TeV with the ATLAS detector
This paper presents the measurement of fiducial and differential cross sections for both the inclusive and electroweak production of a same-sign $W$-boson pair in association with two jets ($W^\pm W^\pm jj$) using 139 fb$^{-1}$ of proton-proton collision data recorded at a centre-of-mass energy of $\sqrt{s}=13$ TeV by the ATLAS detector at the Large Hadron Collider. The analysis is performed by selecting two same-charge leptons, electron or muon, and at least two jets with large invariant mass and a large rapidity difference. The measured fiducial cross sections for electroweak and inclusive $W^\pm W^\pm jj$ production are $2.92 \pm 0.22\, \text{(stat.)} \pm 0.19\, \text{(syst.)}$ fb and $3.38 \pm 0.22\, \text{(stat.)} \pm 0.19\, \text{(syst.)}$ fb, respectively, in agreement with Standard Model predictions. The measurements are used to constrain anomalous quartic gauge couplings by extracting 95% confidence level intervals on dimension-8 operators. A search for doubly charged Higgs bosons $H^{\pm\pm}$ that are produced in vector-boson fusion processes and decay into a same-sign $W$ boson pair is performed. The largest deviation from the Standard Model occurs for an $H^{\pm\pm}$ mass near 450 GeV, with a global significance of 2.5 standard deviations.
1 December 2023
Contact: Standard Model conveners
internal
e-print arXiv:2312.00420 - pdf from arXiv
Figures
Figure 01a
Representative Feynman diagrams for EW VVjj production with a scattering topology that includes either a triple-gauge-boson vertex with an internal electroweak gauge boson in the (a) s-channel or the (b) t-channel, (c) a quartic gauge boson vertex, or the exchange of a Higgs boson in the (d) s-channel or the (e) t-channel. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), the Higgs boson (H) and fermions (f). The s-channel diagrams, (a) and (d), are forbidden in the SM for W±W±jj final states. The diagram (d) is possible in extensions of the SM with a doubly charged Higgs boson. In these and following Feynman diagrams, not all boson combinations are allowed by the Standard Model.
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Figure 01b
Representative Feynman diagrams for EW VVjj production with a scattering topology that includes either a triple-gauge-boson vertex with an internal electroweak gauge boson in the (a) s-channel or the (b) t-channel, (c) a quartic gauge boson vertex, or the exchange of a Higgs boson in the (d) s-channel or the (e) t-channel. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), the Higgs boson (H) and fermions (f). The s-channel diagrams, (a) and (d), are forbidden in the SM for W±W±jj final states. The diagram (d) is possible in extensions of the SM with a doubly charged Higgs boson. In these and following Feynman diagrams, not all boson combinations are allowed by the Standard Model.
png (10kB) pdf (28kB)
Figure 01c
Representative Feynman diagrams for EW VVjj production with a scattering topology that includes either a triple-gauge-boson vertex with an internal electroweak gauge boson in the (a) s-channel or the (b) t-channel, (c) a quartic gauge boson vertex, or the exchange of a Higgs boson in the (d) s-channel or the (e) t-channel. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), the Higgs boson (H) and fermions (f). The s-channel diagrams, (a) and (d), are forbidden in the SM for W±W±jj final states. The diagram (d) is possible in extensions of the SM with a doubly charged Higgs boson. In these and following Feynman diagrams, not all boson combinations are allowed by the Standard Model.
png (9kB) pdf (28kB)
Figure 01d
Representative Feynman diagrams for EW VVjj production with a scattering topology that includes either a triple-gauge-boson vertex with an internal electroweak gauge boson in the (a) s-channel or the (b) t-channel, (c) a quartic gauge boson vertex, or the exchange of a Higgs boson in the (d) s-channel or the (e) t-channel. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), the Higgs boson (H) and fermions (f). The s-channel diagrams, (a) and (d), are forbidden in the SM for W±W±jj final states. The diagram (d) is possible in extensions of the SM with a doubly charged Higgs boson. In these and following Feynman diagrams, not all boson combinations are allowed by the Standard Model.
png (10kB) pdf (28kB)
Figure 01e
Representative Feynman diagrams for EW VVjj production with a scattering topology that includes either a triple-gauge-boson vertex with an internal electroweak gauge boson in the (a) s-channel or the (b) t-channel, (c) a quartic gauge boson vertex, or the exchange of a Higgs boson in the (d) s-channel or the (e) t-channel. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), the Higgs boson (H) and fermions (f). The s-channel diagrams, (a) and (d), are forbidden in the SM for W±W±jj final states. The diagram (d) is possible in extensions of the SM with a doubly charged Higgs boson. In these and following Feynman diagrams, not all boson combinations are allowed by the Standard Model.
png (10kB) pdf (28kB)
Figure 02a
Representative Feynman diagrams for EW VVjj production without vector-boson scattering. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), and fermions (f).
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Figure 02b
Representative Feynman diagrams for EW VVjj production without vector-boson scattering. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), and fermions (f).
png (10kB) pdf (27kB)
Figure 03a
Representative Feynman diagrams for QCD VVjj production with strong interaction vertices. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), fermions (f), and gluons (g). The two diagrams on the right with gluons in the initial state are forbidden for W±W±jj production.
png (10kB) pdf (28kB)
Figure 03b
Representative Feynman diagrams for QCD VVjj production with strong interaction vertices. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), fermions (f), and gluons (g). The two diagrams on the right with gluons in the initial state are forbidden for W±W±jj production.
png (10kB) pdf (27kB)
Figure 03c
Representative Feynman diagrams for QCD VVjj production with strong interaction vertices. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), fermions (f), and gluons (g). The two diagrams on the right with gluons in the initial state are forbidden for W±W±jj production.
png (11kB) pdf (29kB)
Figure 03d
Representative Feynman diagrams for QCD VVjj production with strong interaction vertices. The lines are labelled by quarks (q), vector bosons (V=W/Z/γ), fermions (f), and gluons (g). The two diagrams on the right with gluons in the initial state are forbidden for W±W±jj production.
png (12kB) pdf (30kB)
Figure 04a
Post-fit distributions of (a) mℓℓ in SR, (b) mjj in SR, (c) mℓℓ in low-mjj CR, and (d) event yield in the WZ CR, as obtained in the extraction of the differential cross section of EW W±W±jj production as a function of mℓℓ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Contributions of EW W±W±jj events in SR and low-mjj CR from different particle level mℓℓ bins are presented in different shades of blue, denoted with "bin N" (N=1,2,...,6) in the legend. The last bin of each distribution includes overflow events. The hatched error band on the prediction corresponds to the total uncertainty. The lower panel of each plot shows the ratio of data to prediction.
png (154kB) pdf (77kB)
Figure 04b
Post-fit distributions of (a) mℓℓ in SR, (b) mjj in SR, (c) mℓℓ in low-mjj CR, and (d) event yield in the WZ CR, as obtained in the extraction of the differential cross section of EW W±W±jj production as a function of mℓℓ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Contributions of EW W±W±jj events in SR and low-mjj CR from different particle level mℓℓ bins are presented in different shades of blue, denoted with "bin N" (N=1,2,...,6) in the legend. The last bin of each distribution includes overflow events. The hatched error band on the prediction corresponds to the total uncertainty. The lower panel of each plot shows the ratio of data to prediction.
png (133kB) pdf (14kB)
Figure 04c
Post-fit distributions of (a) mℓℓ in SR, (b) mjj in SR, (c) mℓℓ in low-mjj CR, and (d) event yield in the WZ CR, as obtained in the extraction of the differential cross section of EW W±W±jj production as a function of mℓℓ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Contributions of EW W±W±jj events in SR and low-mjj CR from different particle level mℓℓ bins are presented in different shades of blue, denoted with "bin N" (N=1,2,...,6) in the legend. The last bin of each distribution includes overflow events. The hatched error band on the prediction corresponds to the total uncertainty. The lower panel of each plot shows the ratio of data to prediction.
png (143kB) pdf (77kB)
Figure 04d
Post-fit distributions of (a) mℓℓ in SR, (b) mjj in SR, (c) mℓℓ in low-mjj CR, and (d) event yield in the WZ CR, as obtained in the extraction of the differential cross section of EW W±W±jj production as a function of mℓℓ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Contributions of EW W±W±jj events in SR and low-mjj CR from different particle level mℓℓ bins are presented in different shades of blue, denoted with "bin N" (N=1,2,...,6) in the legend. The last bin of each distribution includes overflow events. The hatched error band on the prediction corresponds to the total uncertainty. The lower panel of each plot shows the ratio of data to prediction.
png (54kB) pdf (12kB)
Figure 05a
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (196kB) pdf (80kB)
Figure 05b
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (178kB) pdf (67kB)
Figure 05c
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (178kB) pdf (67kB)
Figure 05d
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (148kB) pdf (15kB)
Figure 05e
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (181kB) pdf (17kB)
Figure 06a
Measured fiducial cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of predicted to measured cross sections.
png (208kB) pdf (81kB)
Figure 06b
Measured fiducial cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of predicted to measured cross sections.
png (187kB) pdf (68kB)
Figure 06c
Measured fiducial cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of predicted to measured cross sections.
png (190kB) pdf (67kB)
Figure 06d
Measured fiducial cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of predicted to measured cross sections.
png (152kB) pdf (15kB)
Figure 06e
Measured fiducial cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. Different SM predictions as described in the text are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of predicted to measured cross sections.
png (189kB) pdf (18kB)
Figure 07a
The observed mℓℓ distribution and the SM distribution before (a) and after (b) the EFT fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of SM processes, with the hatched error band corresponding to the total uncertainty. In (a), the sums of W±W±jj and WZjj EFT contributions that correspond to the M0 operator with its Wilson coefficient set to its observed upper limit are shown as continuous lines for two cases, one where no unitarisation cut-off is applied, and another where the EFT contributions above mWV > 0.7 TeV are removed. In (b), the continuous line presents the best-fit contribution of the M0 operator without the unitarisation cut-off. Overflow events are included in the last bin. The lower panel shows the ratio of data to SM prediction.
png (147kB) pdf (78kB)
Figure 07b
The observed mℓℓ distribution and the SM distribution before (a) and after (b) the EFT fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of SM processes, with the hatched error band corresponding to the total uncertainty. In (a), the sums of W±W±jj and WZjj EFT contributions that correspond to the M0 operator with its Wilson coefficient set to its observed upper limit are shown as continuous lines for two cases, one where no unitarisation cut-off is applied, and another where the EFT contributions above mWV > 0.7 TeV are removed. In (b), the continuous line presents the best-fit contribution of the M0 operator without the unitarisation cut-off. Overflow events are included in the last bin. The lower panel shows the ratio of data to SM prediction.
png (160kB) pdf (81kB)
Figure 08a
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (93kB) pdf (35kB)
Figure 08b
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (195kB) pdf (36kB)
Figure 08c
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (199kB) pdf (35kB)
Figure 08d
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (197kB) pdf (34kB)
Figure 08e
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (96kB) pdf (35kB)
Figure 08f
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (195kB) pdf (35kB)
Figure 08g
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (180kB) pdf (35kB)
Figure 08h
Evolution of the one-dimensional expected (blue dashed line) and observed (black line) limits at 95 CL on the parameters corresponding to the quartic operators with label (a) M0, (b) M1, (c) M7, (d) S1, (e) S02, (f) T0, (g) T1, and (h) T2 as a function of the cut-off scale. The unitarity bounds (green line) for each operator as a function of the cut-off scale are defined for one non-zero Wilson coefficient following Ref. [Phys. Rev. D 101 (2020) 113003]. The filled area corresponds to parameter values excluded either by the data at 95 CL or by the unitarity condition of the theory. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (190kB) pdf (35kB)
Figure 09a
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (57kB) pdf (26kB)
Figure 09b
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (61kB) pdf (27kB)
Figure 09c
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (72kB) pdf (28kB)
Figure 09d
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (71kB) pdf (30kB)
Figure 09e
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (62kB) pdf (28kB)
Figure 09f
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (51kB) pdf (25kB)
Figure 09g
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters without any unitarisation procedure. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (58kB) pdf (27kB)
Figure 10a
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (121kB) pdf (45kB)
Figure 10b
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (106kB) pdf (38kB)
Figure 10c
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (119kB) pdf (38kB)
Figure 10d
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (130kB) pdf (36kB)
Figure 10e
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (109kB) pdf (44kB)
Figure 10f
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (119kB) pdf (40kB)
Figure 10g
Two-dimensional median expected (dashed line) and observed (solid line) 95% CL intervals on parameters corresponding to the quartic operator combinations (a) M0-M1, (b) M0-M7, (c) M1-M7, (d) S1-S02, (e) T0-T1, (f) T0-T2 and (g) T1-T2 EFT parameters with a unitarisation cut-off scale of 1.5 TeV and unitarity bounds (green line). The two-dimensional unitarity bounds for pairs of operators are obtained for the two non-zero Wilson coefficients from the eigenvalues from Ref. [Phys. Rev. D 101 (2020) 113003]. The 1 (green) and 2 (yellow) sigma bands show the 68.3% and 95.4% CL regions for the expected limit curves, respectively. The limits on M7 are obtained without taking into account the SM-EFT interference term and EFT cross-term for the EW WZjj final state.
png (121kB) pdf (40kB)
Figure 11a
Post-fit (a) mjj and (b) mT inclusive distributions in the signal region for the SM background-only hypothesis. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV, where the sinθH values correspond to the expected 95% CL limits for the respective mass points. The last bin of each distribution includes overflow events. The lower panel shows the ratio of the data to the SM prediction.
png (134kB) pdf (18kB)
Figure 11b
Post-fit (a) mjj and (b) mT inclusive distributions in the signal region for the SM background-only hypothesis. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV, where the sinθH values correspond to the expected 95% CL limits for the respective mass points. The last bin of each distribution includes overflow events. The lower panel shows the ratio of the data to the SM prediction.
png (129kB) pdf (18kB)
Figure 12a
Expected and observed exclusion limits at 95% CL for (a) σVBF(H5±±) × B(H5±± → W±W±) as a function of mH5±±, and for (b) sinθH as a function of mH5±± in the GM model. The green (yellow) band is the 68% (95) confidence interval around the median expected limit. The exclusion limits for sinθH are shown up to mH5±± = 1500 GeV given the low sensitivity in the GM model above that mass. The hatched region covers the parameter space where the intrinsic width of the H++ boson would be larger than 10 of the mass and is disfavoured in the GM model [LHCHXSWG-2015-001].
png (57kB) pdf (15kB)
Figure 12b
Expected and observed exclusion limits at 95% CL for (a) σVBF(H5±±) × B(H5±± → W±W±) as a function of mH5±±, and for (b) sinθH as a function of mH5±± in the GM model. The green (yellow) band is the 68% (95) confidence interval around the median expected limit. The exclusion limits for sinθH are shown up to mH5±± = 1500 GeV given the low sensitivity in the GM model above that mass. The hatched region covers the parameter space where the intrinsic width of the H++ boson would be larger than 10 of the mass and is disfavoured in the GM model [LHCHXSWG-2015-001].
png (133kB) pdf (15kB)
Tables
Table 01
Summary of the MC samples used to simulate signal (upper part of the table) and background (lower part of the table) processes in the signal region. The notation V is used to represent either W or Z/γ*.
png (61kB) pdf (59kB)
Table 03
Expected signal and background yields in the SR@. The yields are shown for different dilepton final states where the first lepton has the highest pT. The "Other prompt" category combines ZZ, VVV, tt̄V, and tZq background processes. The sum of all contributions may differ from the total value due to rounding. The uncertainty includes both the statistical and systematic components.
png (39kB) pdf (46kB)
Table 04
Impact of the uncertainty on the EW W±W±jj cross section measurement. The contribution of a systematic uncertainty (uncertainty group) to the total uncertainty is evaluated by fixing the respective NP (NPs) to its (their) best-fit value(s), redoing the fit, and subtracting the uncertainties of the cross section in quadrature. The procedure is implemented incrementally such that the grouped systematic and statistical uncertainties added in quadrature correspond to the total cross section uncertainty by construction. Lepton calibration uncertainties encompass the effects of calibration of lepton energy or momentum scale and resolution, as well as lepton trigger, reconstruction, identification, and isolation efficiencies. "Background, other" includes normalisation uncertainties of background samples modelled with MC where their normalisation is not obtained in a dedicated CR. The "Model statistical" category is related to the finite number of MC events and data events used for data-driven background estimates.
png (59kB) pdf (53kB)
Table 05
Signal and background yields in the SR after the fit for the EW W±W±jj fiducial cross section. The yields are shown for different dilepton final states where the first lepton has the highest pT. The "Other prompt" category combines ZZ, VVV, tt̄V, and tZq background processes. The sum of all contributions may differ from the total value due to rounding. The uncertainty includes both the statistical and systematic components.
png (37kB) pdf (46kB)
Table 06
Measured and predicted fiducial cross sections of the EW and inclusive W±W±jj production, quoted with their respective uncertainties. For POWHEGBOX+PYTHIA only the central value is provided.
png (34kB) pdf (57kB)
Table 07
(χ2) and (p)-values obtained from the measured differential cross sections and the nominal MGHWshort prediction, computed using the covariance matrix of the measured differential cross section and the difference between data and model. The number of degrees of freedom Ndof is equal to the number of the cross section bins. The uncertainties in the MC prediction are ignored when computing χ2 and p-values. The values are provided for both EW and inclusive differential W±W±jj cross sections. The last column shows the maximum value of the respective variable observed in data.
png (22kB) pdf (51kB)
Table 08
Expected and observed limits on the Wilson coefficients for various operators without any unitarisation procedure and with a unitarisation cut-off at the unitarity bound. The last column represents lower and upper limits at the respective cut-off value, where the unitarity bound and experimental bound cross. Cases where no crossing with the unitarity bound was found in the scanned region above 600 GeV are labelled by "–". The notation S02 is used to indicate that the coefficients corresponding to the operators OS0 and OS2 are assigned the same value. The limits on M7 are obtained without taking into account the SM-EFT interference for the EW WZjj final state.
png (56kB) pdf (54kB)
Auxiliary material
Figure 01a
Pre-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 01b
Pre-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (14kB)
Figure 01c
Pre-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (14kB)
Figure 01d
Pre-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (14kB)
Figure 02a
Pre-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (119kB) pdf (13kB)
Figure 02b
Pre-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (116kB) pdf (13kB)
Figure 02c
Pre-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (116kB) pdf (13kB)
Figure 02d
Pre-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (116kB) pdf (13kB)
Figure 03
Pre-fit yields in the WZ control region used in the fit measuring σfidEW. Data point is shown as a black marker with the vertical error bar representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. Overflow events are included. The lower panel shows the ratio of data to prediction.
png (58kB) pdf (12kB)
Figure 04a
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 04b
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 04c
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 04d
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 05a
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (114kB) pdf (13kB)
Figure 05b
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (112kB) pdf (13kB)
Figure 05c
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (110kB) pdf (13kB)
Figure 05d
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (110kB) pdf (13kB)
Figure 06
Post-fit yields in the WZ control region used in the fit measuring σfidEW. Data point is shown as a black marker with the vertical error bar representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. Overflow events are included. The lower panel shows the ratio of data to prediction.
png (54kB) pdf (12kB)
Figure 07a
Post-fit (a) yields in the low-mjj CR and (b) mjj-distribution in the SR, as obtained in the fit measuring σfidEW, without splitting by the dilepton flavour. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (109kB) pdf (13kB)
Figure 07b
Post-fit (a) yields in the low-mjj CR and (b) mjj-distribution in the SR, as obtained in the fit measuring σfidEW, without splitting by the dilepton flavour. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (129kB) pdf (14kB)
Figure 08
Ranking of the systematic nuisance parameters included in the fit measuring σfidEW according to their impact on the measured signal strength μsigEW using observed data. The top 20 parameters are shown. The empty brown rectangles correspond to the pre-fit impact on μsigEW and the filled brown ones to the post-fit impact on μsigEW, both referring to the upper scale. The impact of each nuisance parameter, Δμ, is computed by comparing the nominal best-fit μsigEW with the result of the fit when fixing the considered nuisance parameter to its best-fit value, θ̂, shifted by its pre-fit (post-fit) uncertainties ±Δθ (±Δθ̂). The black points show the pulls of the nuisance parameters with respect to their nominal values, θ0. These pulls and their relative post-fit errors, Δθ̂/Δθ, refer to the lower scale. In case of WZ background normalisation, which is a free parameter in the fit, the lower scale corresponds to the post-fit value and uncertainty of this parameter. For experimental uncertainties which are broken down into several independent sources, the corresponding nuisance parameter (NP) index is reported.
png (158kB) pdf (17kB)
Figure 09a
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 09b
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (122kB) pdf (14kB)
Figure 09c
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (14kB)
Figure 09d
Post-fit mjj-distributions in the SR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (14kB)
Figure 10a
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (60kB) pdf (13kB)
Figure 10b
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (110kB) pdf (13kB)
Figure 10c
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (111kB) pdf (13kB)
Figure 10d
Post-fit mjj-distributions in the low-mjj CR for different flavour channels as used in the fit measuring σfidEW+Int+QCD: (a) ee, (b) eμ, (c) μ e and (d) μμ. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. For all distributions, overflow events are included. The lower panel of each plot shows the ratio of data to prediction.
png (109kB) pdf (13kB)
Figure 11
Post-fit yields in the WZ control region used in the fit measuring σfidEW+Int+QCD. Data point is shown as a black marker with the vertical error bar representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. Overflow events are included. The lower panel shows the ratio of data to prediction.
png (54kB) pdf (12kB)
Figure 12
Ranking of the systematic nuisance parameters included in the fit measuring σfidEW+Int+QCD according to their impact on the measured signal strength μsigEW+Int+QCD using observed data. The top 20 parameters are shown. The empty brown rectangles correspond to the pre-fit impact on μsigEW+Int+QCD and the filled brown ones to the post-fit impact on μsigEW+Int+QCD, both referring to the upper scale. The impact of each nuisance parameter, Δμ, is computed by comparing the nominal best-fit μsigEW+Int+QCD with the result of the fit when fixing the considered nuisance parameter to its best-fit value, θ̂, shifted by its pre-fit (post-fit) uncertainties ±Δθ (±Δθ̂). The black points show the pulls of the nuisance parameters with respect to their nominal values, θ0. These pulls and their relative post-fit errors, Δθ̂/Δθ, refer to the lower scale. In case of WZ background normalisation, which is a free parameter in the fit, the lower scale corresponds to the post-fit value and uncertainty of this parameter. For experimental uncertainties which are broken down into several independent sources, the corresponding nuisance parameter (NP) index is reported.
png (157kB) pdf (17kB)
Figure 13a
A summary of measured and predicted (a) EW and (b) inclusive W±W±jj fiducial cross sections. The measured cross sections are represented by dashed lines, with the hatched (solid) bands corresponding to the statistical (total) uncertainty. Various predictions are shown as black markers with the inner (outer) error bars corresponding to the PDF (total) uncertainty.
png (88kB) pdf (16kB)
Figure 13b
A summary of measured and predicted (a) EW and (b) inclusive W±W±jj fiducial cross sections. The measured cross sections are represented by dashed lines, with the hatched (solid) bands corresponding to the statistical (total) uncertainty. Various predictions are shown as black markers with the inner (outer) error bars corresponding to the PDF (total) uncertainty.
png (89kB) pdf (16kB)
Figure 14a
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (123kB) pdf (93kB)
Figure 14b
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (124kB) pdf (93kB)
Figure 14c
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (92kB)
Figure 14d
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (126kB) pdf (92kB)
Figure 14e
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (120kB) pdf (92kB)
Figure 14f
Pre-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (125kB) pdf (92kB)
Figure 15
Pre-fit distribution of the dilepton invariant mass (mℓℓ) in the low-mjj CR showing the mℓℓ slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. Overflow events are included in the last bin. The lower panel shows the ratio of data to prediction.
png (138kB) pdf (77kB)
Figure 16a
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (127kB) pdf (93kB)
Figure 16b
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (127kB) pdf (93kB)
Figure 16c
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (124kB) pdf (92kB)
Figure 16d
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (132kB) pdf (93kB)
Figure 16e
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (125kB) pdf (92kB)
Figure 16f
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the dilepton mass (mℓℓ) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 20 ≤ mℓℓ <80 GeV, (b) 80 ≤ mℓℓ < 130 GeV, (c) 130 ≤ mℓℓ < 170 GeV, (d) 170 ≤ mℓℓ < 220 GeV, (e) 220 ≤ mℓℓ < 320 GeV, and (f) mℓℓ ≥ 320 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction. The corresponding post-fit distributions in the low-mjj and WZ CRs are shown in Figure 4(c) and (d), respectively.
png (131kB) pdf (93kB)
Figure 17a
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (121kB) pdf (80kB)
Figure 17b
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (125kB) pdf (80kB)
Figure 17c
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (125kB) pdf (80kB)
Figure 17d
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (123kB) pdf (80kB)
Figure 17e
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (125kB) pdf (80kB)
Figure 17f
Post-fit distributions of the dijet invariant mass (mjj) in the signal region split into the transverse mass of the dilepton + ETmiss system (mT) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 0 ≤ mT <170 GeV, (b) 170 ≤ mT < 210 GeV, (c) 210 ≤ mT < 250 GeV, (d) 250 ≤ mT < 310 GeV, (e) 310 ≤ mT < 410 GeV, and (f) mT ≥ 410 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (132kB) pdf (80kB)
Figure 18
Post-fit distribution of the transverse mass of the dilepton + ETmiss system (mT) in the low-mjj CR showing the mT slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. Overflow events are included in the last bin. The lower panel shows the ratio of data to prediction.
png (138kB) pdf (64kB)
Figure 19a
Pre-fit (a) and post-fit (b) distribution of the transverse mass of the dilepton + ETmiss system (mT) in the signal region showing the mT slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (132kB) pdf (64kB)
Figure 19b
Pre-fit (a) and post-fit (b) distribution of the transverse mass of the dilepton + ETmiss system (mT) in the signal region showing the mT slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (150kB) pdf (64kB)
Figure 20a
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (124kB) pdf (92kB)
Figure 20b
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (126kB) pdf (93kB)
Figure 20c
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (127kB) pdf (93kB)
Figure 20d
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (125kB) pdf (92kB)
Figure 20e
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (126kB) pdf (92kB)
Figure 20f
Post-fit distributions of the dilepton invariant mass (mℓℓ) in the signal region split into the dijet invariant mass (mjj) slices used in the fit for the extraction of the differential cross section of the EW W±W±jj production: (a) 500 ≤ mjj <1000 GeV, (b) 1000 ≤ mjj < 1300 GeV, (c) 1300 ≤ mjj < 1600 GeV, (d) 1600 ≤ mjj < 2000 GeV, (e) 2000 ≤ mjj < 2900 GeV, and (f) mjj ≥ 2900 GeV. Data are shown as black markers with vertical error bars representing the statistical uncertainty. The hatched error band around the model prediction represents the total uncertainty of the model, with statistical and systematic uncertainties added in quadrature. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to prediction.
png (130kB) pdf (92kB)
Figure 21a
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (153kB) pdf (78kB)
Figure 21b
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (137kB) pdf (64kB)
Figure 21c
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (138kB) pdf (64kB)
Figure 21d
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (131kB) pdf (13kB)
Figure 21e
Fiducial differential cross sections for the EW W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (145kB) pdf (15kB)
Figure 22a
Fiducial differential cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (165kB) pdf (78kB)
Figure 22b
Fiducial differential cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (144kB) pdf (65kB)
Figure 22c
Fiducial differential cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (147kB) pdf (65kB)
Figure 22d
Fiducial differential cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (132kB) pdf (14kB)
Figure 22e
Fiducial differential cross sections for inclusive W±W±jj production as a function of (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3. The measured data are shown as black points with horizontal bars indicating the bin range and hatched (filled) boxes representing the systematic (total) uncertainty. The SM predictions from SHERPA are compared to the data. The vertical error bars shown on the predictions correspond to the uncertainty coming from the variations of the renormalisation and factorisation scales, PDF and αS. Overflow events are included in the last bin. The lower panel of each plot shows the ratio of the predicted to measured cross sections.
png (155kB) pdf (16kB)
Figure 23a
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (a) mℓℓ
png (92kB) pdf (77kB)
Figure 23b
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (b) mT
png (97kB) pdf (16kB)
Figure 23c
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (c) mjj
png (96kB) pdf (16kB)
Figure 23d
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (d) Ngap jets
png (61kB) pdf (14kB)
Figure 23e
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (e) ξj3
png (85kB) pdf (16kB)
Figure 24a
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (a) mℓℓ
png (95kB) pdf (77kB)
Figure 24b
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (b) mT
png (97kB) pdf (16kB)
Figure 24c
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (c) mjj
png (99kB) pdf (16kB)
Figure 24d
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (d) Ngap jets
png (63kB) pdf (15kB)
Figure 24e
Expected correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (e) ξj3
png (86kB) pdf (16kB)
Figure 25a
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (a) mℓℓ
png (94kB) pdf (77kB)
Figure 25b
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (b) mT
png (100kB) pdf (16kB)
Figure 25c
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (c) mjj
png (100kB) pdf (16kB)
Figure 25d
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (d) Ngap jets
png (62kB) pdf (14kB)
Figure 25e
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW fit. (e) ξj3
png (87kB) pdf (15kB)
Figure 26a
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (a) mℓℓ
png (93kB) pdf (77kB)
Figure 26b
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (b) mT
png (102kB) pdf (16kB)
Figure 26c
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (c) mjj
png (97kB) pdf (16kB)
Figure 26d
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (d) Ngap jets
png (63kB) pdf (14kB)
Figure 26e
Observed correlations between the bins of the LH-unfolded distributions shown considering the total uncertainty for the unfolded variables (a) mℓℓ, (b) mT, (c) mjj, (d) Ngap jets, and (e) ξj3 in the case of the EW+Int+QCD fit. (e) ξj3
png (85kB) pdf (16kB)
Figure 27
Data and SM expected mℓℓ distribution. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the outer (inner) hatched error band corresponding to the total (statistical) uncertainty. The W±W±jj EFT contributions corresponding to the M0 operator for cases when the corresponding Wilson coefficient is set to its observed upper limit value when no unitarisation cut-off is applied and for the respective observed upper limit value when the EFT contributions above mWW > 0.7 TeV are removed are shown as continuous lines. Dashed lines show the corresponding WZjj EFT contributions. Overflow events are included in the last bin. The lower panel shows the ratio of data to SM prediction.
png (158kB) pdf (78kB)
Figure 28a
Post-fit mT distributions in slices of mjj in the signal region for the SM background only hypothesis: (a) 500 ≤ mjj <850 GeV, (b) 850 ≤ mjj <1450 GeV, (c) 1450 ≤ mjj <2100 GeV, (d) 2100 ≤ mjj <2550 GeV, and (e) mjj ≥ 2550 GeV. The mT and mjj binning corresponds to the one used in the fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to SM prediction.
png (135kB) pdf (18kB)
Figure 28b
Post-fit mT distributions in slices of mjj in the signal region for the SM background only hypothesis: (a) 500 ≤ mjj <850 GeV, (b) 850 ≤ mjj <1450 GeV, (c) 1450 ≤ mjj <2100 GeV, (d) 2100 ≤ mjj <2550 GeV, and (e) mjj ≥ 2550 GeV. The mT and mjj binning corresponds to the one used in the fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to SM prediction.
png (140kB) pdf (18kB)
Figure 28c
Post-fit mT distributions in slices of mjj in the signal region for the SM background only hypothesis: (a) 500 ≤ mjj <850 GeV, (b) 850 ≤ mjj <1450 GeV, (c) 1450 ≤ mjj <2100 GeV, (d) 2100 ≤ mjj <2550 GeV, and (e) mjj ≥ 2550 GeV. The mT and mjj binning corresponds to the one used in the fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to SM prediction.
png (144kB) pdf (18kB)
Figure 28d
Post-fit mT distributions in slices of mjj in the signal region for the SM background only hypothesis: (a) 500 ≤ mjj <850 GeV, (b) 850 ≤ mjj <1450 GeV, (c) 1450 ≤ mjj <2100 GeV, (d) 2100 ≤ mjj <2550 GeV, and (e) mjj ≥ 2550 GeV. The mT and mjj binning corresponds to the one used in the fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to SM prediction.
png (135kB) pdf (18kB)
Figure 28e
Post-fit mT distributions in slices of mjj in the signal region for the SM background only hypothesis: (a) 500 ≤ mjj <850 GeV, (b) 850 ≤ mjj <1450 GeV, (c) 1450 ≤ mjj <2100 GeV, (d) 2100 ≤ mjj <2550 GeV, and (e) mjj ≥ 2550 GeV. The mT and mjj binning corresponds to the one used in the fit. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty of the model. The lines show the prediction of the H5±± model for values of sinθH = 0.21 and mH5±± = 300 GeV, sinθH = 0.25 and mH5±± = 450 GeV, and sinθH = 0.32 and mH5±± = 1000 GeV. The last bin of each distribution includes overflow events. The lower panel of each plot shows the ratio of data to SM prediction.
png (134kB) pdf (18kB)
Table 01
Impact of the uncertainty on the total W±W±jj cross section measurement. The contribution of a systematic uncertainty (uncertainty group) to the total uncertainty is evaluated by fixing the respective NP (NPs) to its (their) best-fit value(s), redoing the fit, and subtracting the uncertainties on the cross section in quadrature. The procedure is implemented incrementally such that the grouped systematic and statistical uncertainties added in quadrature correspond to the total cross section uncertainty by construction. Lepton calibration uncertainties encompass effects of calibration of lepton energy or momentum scale and resolution, as well as lepton trigger, reconstruction, identification, and isolation efficiencies. "Background, other" includes normalisation uncertainties of background samples modelled with MC where their normalisation is not obtained in a dedicated CR. The "Model statistical" category is related to the finite number of MC events and data events used for data-driven background estimates.
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Table 02
Fitted values of the EW W±W±jj signal strength and QCD WZjj background normalisation parameter as obtained in the fit for extracting differential cross section of the EW W±W±jj production as a function of mℓℓ. Shown are the parameter values together with their statistical, modelling systematic, experimental systematic, and luminosity uncertainties.
png (39kB) pdf (52kB)
Table 03
Fitted values of the EW W±W±jj signal strength and QCD WZjj background normalisation parameter as obtained in the fit for extracting differential cross section of the EW W±W±jj production as a function of mT. Shown are the parameter values together with their statistical, modelling systematic, experimental systematic, and luminosity uncertainties.
png (38kB) pdf (52kB)
Table 04
Fitted values of the EW W±W±jj signal strength and QCD WZjj background normalisation parameter as obtained in the fit for extracting differential cross section of the EW W±W±jj production as a function of mjj. Shown are the parameter values together with their statistical, modelling systematic, experimental systematic, and luminosity uncertainties.
png (31kB) pdf (52kB)