Abstract: A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults.

Abstract. A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults.

A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults.

A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults, using the Jump ...

Yu-Long Kao, Wei-Shun Chuang, James Chien-Mo Li: Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis. ITC 2006: 1-9.

A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults.

Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis. Kao Y., Chuang W., Li J. Expand. Publication type: Proceedings Article.

To tighten the bounds of candidate scan cells quickly, the Jump simulation is proposed in [8]. Although the jump simulation method quickly identifies a pair of ...

Mar 25, 2024 · Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault.

Li, “Jump Simulation: A. Technique for Fast and Precise Scan Chain Fault Diagnosis,”. Proc. Int'l Test Conf. (ITC), 2006, pp. 1-9. [13] R. Guo, Y. Huang, and ...