Very repeatable needle contact conditions. Customized needle loadings which directly indicate the set load.
Micrometer controlled slice displacement. Four-point measurement of wafer resistivity and measurements of three-point spreading resistance. Hinged steel cover to exclude effects of light and eliminate electrical interference. Universal Probe suitable in making both four point probe measurements and 3-point spreading resistance measurements. The biggest sample size is 76mm. There is an X-Y stage offering micromanipulation over 25mm intended for targeting small samples or for micro movements during spreading resistance measurements. All four probe needles are custom adjustable for load and the needles can be individually changed by the end user.
Note: 3-point Spreading resistance measurements are an expert area of measurement which require careful preparation of samples and in depth handling of the measurement process. Unfortunately we are NOT able to advise on sample preparation and measurement process for this type of measurement.