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Analysis of EME produced by a microcontroller operation

Published: 13 March 2001 Publication History
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References

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H. Ott, Noise reduction techniques in electronics system, znd Ed. John Wiley & Sons, 1988.]]
[2]
C. R. Paul, Introduction to Electromagnetic Compatibility, John Wiley & Sons, 1992.]]
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M. I. Montrose, Printed circuited board design techniques for EMC compliance. IEEE press series on electronics technology.]]
[4]
K. P. Slattery, J. W. Neal, Wei Qui, "Near-field measurements of VLSI devices", IEEE Transaction on Electromagnetic Compatibility, Vol. EMC-41, No. 4, November 1999, pp. 374-384.]]
[5]
Electromagnetic compatibility measurement procedures for integrated circuits - integrated circuit radiated emissions measurement procedure, 150 kHz to 1000 MHz, TEM Cell - SAE Surface Vehicle Recommended Practice J1752/3, Society of Automotive Engineers, Warrendale, PA, 1995.]]
[6]
Integrated Circuits, Measurements of Conducted Electromagnetic Emission, IEC 61967 CDV 0.1, VDE AK767.13/14.5.]]
[7]
J. P. Muccioli, S. E. Ashley, "Radiated emissions of very large scale integrated circuits", IEEE 1990 International Symposium on Electromagnetic Compatibility, pp. 292-299.]]
[8]
J. P. Muccioli, T. M. North, K. P. Slattery, "Investigation of the theoretical basis for using a 1 GHz TEM cell to evaluate the radiated emissions from integrated circuits", IEEE 1996 International Symposium on Electromagnetic Compatibility, Santa Clara, CA, pp. 63-67.]]
[9]
M. L. Crawford, "Generation of standard EM fields using TEM transmission cells", IEEE Transaction on Electromagnetic Compatibility, Vol. EMC-16, No. 4, November 1974 pp. 189-195.]]
[10]
ST Microelectronics, ST7225 8-bit MCU with 8K ROM, 256 RAM, ADC, WDG, two timers, SPI and 12C bus interfaces.]]
[11]
ST Microelectronics, ST7 Family Programming Manual.]]

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Published In

cover image ACM Conferences
DATE '01: Proceedings of the conference on Design, automation and test in Europe
March 2001
756 pages
ISBN:0769509932

Sponsors

  • EDAA: European Design Automation Association
  • IFIP WG 10.5: IFIP WG 10.5
  • ECSI
  • EDAC: Electronic Design Automation Consortium
  • SIGDA: ACM Special Interest Group on Design Automation
  • IEEE-CS\TTTC: Test Technology Technical Council
  • IEEE-CS\DATC: IEEE Computer Society
  • The Russian Academy of Sciences: The Russian Academy of Sciences

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IEEE Press

Publication History

Published: 13 March 2001

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DATE01
Sponsor:
  • EDAA
  • IFIP WG 10.5
  • EDAC
  • SIGDA
  • IEEE-CS\TTTC
  • IEEE-CS\DATC
  • The Russian Academy of Sciences

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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