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On the test of microprocessor IP cores

Published: 13 March 2001 Publication History
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References

[1]
S.Thatte,J.Abraham,"TestGeneration for Microprocessors", IEEE Trans. on Computers, Vol. C-29, June 1980, pp. 429-441
[2]
L. Chen, S. Dey, "DEFUSE: A Deterministic Functional Self-Test Methodology for Processors", IEEE VLSI Test Symposium, 2000, pp. 255-262
[3]
K. Batcher, C. Papachristou, "Instruction Randomization Self Test For Processor Cores", Proc. IEEE VLSI Test Symposium, 1999, pp. 34-40
[4]
C.A. Papachristou, F. Martin, M. Nourani, "Microprocessor Based Testing for Core-Based System on Chip,"ACM/IEEE Design Automation Conf., 1999, pp. 586-591
[5]
T.M. Niermann, W.-T. Cheng, J.H. Patel, "PROOFS: A Fast, Memory-Efficient Sequential Circuit Fault Simulator," IEEE Trans. on CAD/ICAS, Vol. 11, No. 2, February 1992, pp. 198-207
[6]
J. Shen, J. Abraham, D. Baker, T. Hurson, M. Kinkade, "Functional verification of the Equator MAP1000 microprocessor," Proceedings 36 th Design Automation Conference, 1999, pp. 169 -174
[7]
N. Utamaphethai, R.D. Blanton and J.P. Shen, "Superscalar Processor Validation at the Microarchitecture Level," 12 th IEEE International Conference on VLSI Design, 1999, pp. 300-305

Cited By

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  • (2011)Evolution of test programs exploiting a FSM processor modelProceedings of the 2011 international conference on Applications of evolutionary computation - Volume Part II10.5555/2008445.2008465(162-171)Online publication date: 27-Apr-2011
  • (2008)Functional self-testing for bus-based symmetric multiprocessorsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403690(1304-1309)Online publication date: 10-Mar-2008
  • (2008)A hybrid software-based self-testing methodology for embedded processorProceedings of the 2008 ACM symposium on Applied computing10.1145/1363686.1364043(1528-1534)Online publication date: 16-Mar-2008
  • Show More Cited By

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Information & Contributors

Information

Published In

cover image ACM Conferences
DATE '01: Proceedings of the conference on Design, automation and test in Europe
March 2001
756 pages
ISBN:0769509932

Sponsors

  • EDAA: European Design Automation Association
  • IFIP WG 10.5: IFIP WG 10.5
  • ECSI
  • EDAC: Electronic Design Automation Consortium
  • SIGDA: ACM Special Interest Group on Design Automation
  • IEEE-CS\TTTC: Test Technology Technical Council
  • IEEE-CS\DATC: IEEE Computer Society
  • The Russian Academy of Sciences: The Russian Academy of Sciences

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IEEE Press

Publication History

Published: 13 March 2001

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DATE01
Sponsor:
  • EDAA
  • IFIP WG 10.5
  • EDAC
  • SIGDA
  • IEEE-CS\TTTC
  • IEEE-CS\DATC
  • The Russian Academy of Sciences

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

View all
  • (2011)Evolution of test programs exploiting a FSM processor modelProceedings of the 2011 international conference on Applications of evolutionary computation - Volume Part II10.5555/2008445.2008465(162-171)Online publication date: 27-Apr-2011
  • (2008)Functional self-testing for bus-based symmetric multiprocessorsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403690(1304-1309)Online publication date: 10-Mar-2008
  • (2008)A hybrid software-based self-testing methodology for embedded processorProceedings of the 2008 ACM symposium on Applied computing10.1145/1363686.1364043(1528-1534)Online publication date: 16-Mar-2008
  • (2007)A software-based methodology for the generation of peripheral test sets based on high-level descriptionsProceedings of the 20th annual conference on Integrated circuits and systems design10.1145/1284480.1284571(348-353)Online publication date: 3-Sep-2007
  • (2007)Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral coresProceedings of the 9th annual conference on Genetic and evolutionary computation10.1145/1276958.1277342(1912-1919)Online publication date: 7-Jul-2007
  • (2006)Software-based self-test of processors under power constraintsProceedings of the conference on Design, automation and test in Europe: Proceedings10.5555/1131481.1131597(430-435)Online publication date: 6-Mar-2006
  • (2006)A brief survey of μGPACM SIGEVOlution10.1145/1147192.11471951:2(17-21)Online publication date: 1-Jun-2006
  • (2006)Systematic software-based self-test for pipelined processorsProceedings of the 43rd annual Design Automation Conference10.1145/1146909.1147014(393-398)Online publication date: 24-Jul-2006
  • (2005)Automatic generation of test sets for SBST of microprocessor IP coresProceedings of the 18th annual symposium on Integrated circuits and system design10.1145/1081081.1081105(74-79)Online publication date: 4-Sep-2005
  • (2005)Software-Based Self-Testing of Embedded ProcessorsIEEE Transactions on Computers10.1109/TC.2005.6854:4(461-475)Online publication date: 1-Apr-2005
  • Show More Cited By

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