Nothing Special   »   [go: up one dir, main page]

skip to main content
10.5555/1899721.1899767acmconferencesArticle/Chapter ViewAbstractPublication PagesaspdacConference Proceedingsconference-collections
research-article

A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel

Published: 18 January 2010 Publication History

Abstract

To cope with an increasing complexity when analyzing analog mismatch in sub-90nm designs, this paper presents a fast non-Monte-Carlo method to calculate mismatch in time domain. The local random mismatch is described by a noise source with an explicit dependence on geometric parameters, and is further expanded by stochastic orthogonal polynomials (SOPs). This forms a stochastic differential-algebra-equation (SDAE). To deal with large-scale problems, the SDAE is linearized at a number of snapshots along the nominal transient trajectory, and hence is naturally embedded into a trajectory-piecewise-linear (TPWL) macromodeling. The TPWL is improved with a novel incremental aggregation of sub-spaces identified at those snapshots. Experiments show that the proposed method, is TPWL, is hundreds of times faster than Monte-Carlo method with a similar accuracy. In addition, our macromodel further reduces runtime by up to 25X, and is faster to build and more accurate to simulate compared to existing approaches.

References

[1]
H. Masuda, S. Ohkawa, A. Kurokawa, and M. Aoki, "Challenge: Variability characterization and modeling for 65- to 90-nm processes," in Proc. IEEE CICC, 2005.
[2]
J. Kim, K. Jones, and M. Horowitz, "Fast, non-monte-carlo estimation of transient performance variation due to device mismatch," in Proc. ACM/IEEE DAC, 2007.
[3]
M. Pelgrom, A. Duinmaijer, and A. Welbers, "Matching properties of mos transistors," IEEE JSSC, pp. 1433--1439, 1989.
[4]
J. Oehm and K. Schumacher, "Quality assurance and upgrade of analog characteristics by fast mismatch analysis option in network analysis environment," IEEE JSSC, pp. 865--871, 1993.
[5]
C. McAndrew, J. Bates, R. Ida, and P. Drennan, "Efficient statistical BJT modeling, why beta is more than ic/ib," in Proc. IEEE Bipolar/BiCMOS Circuits and Tech. Meeting, 1997.
[6]
G. Biagetti, S. Orcioni, C. Turchetti, P. Crippa, and M. Alessandrini, "SiSMA: A tool for efficient analysis of analog cmos integrated circuits affected by device mismatch," IEEE Trans. on CAD, pp. 192--207, 2004.
[7]
A. Demir, E. Liu, and A. Sangiovanni-Vincentelli, "Time-domain non-monte carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations," IEEE Trans. on CAD, pp. 493--505, 1996.
[8]
M. Rewienski and J. White, "A trajectory piecewise-linear approach to model order reduction and fast simulation of nonlinear circuits and micromachined devices," IEEE Trans. on CAD, pp. 155--170, 2003.
[9]
S. K. Tiwary and R. A. Rutenbar, "Faster, parametric trajectory-based macromodels via localized linear reductions," in Proc. IEEE/ACM ICCAD, 2006.
[10]
C. J. Gu and J. Roychowdhury, "Model reduction via projection onto nonlinear manifolds, with applications to analog circuits and biochemical systems," in Proc. IEEE/ACM ICCAD, 2008.
[11]
D. Xiu and G. Karniadakis, "The Wiener-Askey polynomial chaos expansion for stochastic differential equations," SIAM J. Scientific Computing, pp. 619--644, 2002.
[12]
S. Vrudhula, J. M. Wang, and P. Ghanta, "Hermite polynomial based interconnect analysis in the presence of process variations," IEEE Trans. on CAD, pp. 2001--2011, 2006.
[13]
P. Feldmann and R. W. Freund, "Efficient linear circuit analysis by pade approximation via the lanczos process," IEEE Trans. on CAD, pp. 639--649, 1995.
[14]
A. Odabasioglu, M. Celik, and L. Pileggi, "PRIMA: Passive reduced-order interconnect macro-modeling algorithm," IEEE Trans. on CAD, pp. 645--654, 1998.
[15]
J. Roychowdhury, "Reduced-order modelling of time-varying systems," in Proc. ASPDAC, 1999.

Cited By

View all
  • (2015)A New Uncertainty Budgeting-Based Method for Robust Analog/Mixed-Signal DesignACM Transactions on Design Automation of Electronic Systems10.1145/277895921:1(1-25)Online publication date: 2-Dec-2015
  • (2012)A new uncertainty budgeting based method for robust analog/mixed-signal designProceedings of the 49th Annual Design Automation Conference10.1145/2228360.2228455(529-535)Online publication date: 3-Jun-2012
  • (2012)A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal PolynomialsACM Transactions on Design Automation of Electronic Systems10.1145/2071356.207136617:1(1-23)Online publication date: 1-Jan-2012
  • Show More Cited By

Recommendations

Comments

Please enable JavaScript to view thecomments powered by Disqus.

Information & Contributors

Information

Published In

cover image ACM Conferences
ASPDAC '10: Proceedings of the 2010 Asia and South Pacific Design Automation Conference
January 2010
920 pages
ISBN:9781605588377

Sponsors

Publisher

IEEE Press

Publication History

Published: 18 January 2010

Check for updates

Qualifiers

  • Research-article

Conference

ASPDAC '10
Sponsor:

Acceptance Rates

Overall Acceptance Rate 466 of 1,454 submissions, 32%

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • Downloads (Last 12 months)1
  • Downloads (Last 6 weeks)0
Reflects downloads up to 13 Feb 2025

Other Metrics

Citations

Cited By

View all
  • (2015)A New Uncertainty Budgeting-Based Method for Robust Analog/Mixed-Signal DesignACM Transactions on Design Automation of Electronic Systems10.1145/277895921:1(1-25)Online publication date: 2-Dec-2015
  • (2012)A new uncertainty budgeting based method for robust analog/mixed-signal designProceedings of the 49th Annual Design Automation Conference10.1145/2228360.2228455(529-535)Online publication date: 3-Jun-2012
  • (2012)A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal PolynomialsACM Transactions on Design Automation of Electronic Systems10.1145/2071356.207136617:1(1-23)Online publication date: 1-Jan-2012
  • (2010)QuickYieldProceedings of the 47th Design Automation Conference10.1145/1837274.1837372(392-397)Online publication date: 13-Jun-2010

View Options

Login options

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Figures

Tables

Media

Share

Share

Share this Publication link

Share on social media