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CERN Document Server 找到 8 笔记录  检索需时 1.16 秒. 
1.
Pulsed Electron Beam induced SEU Effects in a SRAM memory / Wyrwoll, Vanessa (CERN ; Oslo U.) ; Røed, Ketil (Oslo U.) ; Alía, Rubén García (CERN) ; Delfs, Björn (Oldenburg U.) ; Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Farabolini, Wilfrid (CERN ; Saclay) ; Gilardi, Antonio (CERN ; U. Naples (main) ; LBNL, Berkeley ; INFN, Naples) ; Corsini, Roberto (CERN)
Single Event Effects (SEEs) correlated to pulsed beam effects induced by high energy electrons in a very well-established device, such as the ESA SEU (Singe Event Upset) monitor, are investigated in this paper. Measurements with different electron intensities have been performed at VESPER (The Very energetic Electron facility for Space Planetary Exploration missions in harsh Radiative environments) at the CERN Linear Electron Accelerator for Research (CLEAR) focused on very high dose rates per pulse. [...]
2021 - 7 p. - Published in : 10.1109/RADECS53308.2021.9954561
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2021), Vienna, Austria, 13 - 17 Sep 2021, pp.1-7
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2.
Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation / Røed, Ketil (Oslo U.) ; Eriksen, Dag Øistein (Oslo U.) ; Ceccaroli, Bruno (Unlisted, NO) ; Martinella, Corinna (Jyvaskyla U. ; CERN) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U.) ; Reshanov, Sergey (Unlisted, SE) ; Massetti, Silvia (ESTEC, Noordwijk)
The radiation tolerance of isotopic enriched and natural silicon carbide junction barrier Schottky diodes are compared under heavy ion irradiation. Both types of devices experience leakage current degradation as well as single-event burnout events. [...]
2022 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1675-1682 Fulltext from publisher: PDF;
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3.
Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high Energies / Wyrwoll, Vanessa (CERN) ; García Alía, Rubén (CERN) ; Røed, Ketil (Oslo U.) ; Fernández-Martínez, Pablo (CERN) ; Kastriotou, Maria (CERN) ; Cecchetto, Matteo (CERN) ; Kerboub, Nourdine (CERN) ; Tali, Maris (CERN) ; Cerutti, Francesco (CERN)
We perform Monte Carlo (MC) simulations to describe heavy ion (HI) nuclear interactions in a broad energy range (4 MeV/n–150 GeV/n), focusing on the single event effect (SEE) sub-linear energy transfer (LET) impact. Previously retrieved single event latch-up (SEL) experimental data have indicated that standard energy ions (~10 MeV/n) can produce high-LET secondaries through fusion reactions which are expected to strongly influence the SEE cross section in the sub-LET region. [...]
2020 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1590-1598 Fulltext from publisher: PDF;
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4.
Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies / Wyrwoll, Vanessa (CERN) ; Alia, Rubén García (CERN) ; Røed, Ketil (Oslo U.) ; Cazzaniga, Carlo (Rutherford) ; Kastriotou, Maria (CERN) ; Fernández-Martínez, Pablo (CERN) ; Coronetti, Andrea (CERN) ; Cerutti, Francesco (CERN)
Ultrahigh-energy (UHE) heavy ions show various advantages at testing single-event effect (SEE) in modern technologies, due to their highly penetrating nature. However, the intercepting material in the beam line contributes to the modification of the beam structure by generation of fragments produced via nuclear interactions. [...]
2020 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1530-1539 Fulltext from publisher: PDF;
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5.
Single event effects in high-energy accelerators / García Alía, Rubén (CERN) ; Brugger, Markus (CERN) ; Danzeca, Salvatore (CERN) ; Cerutti, Francesco (CERN) ; de Carvalho Saraiva, Joao Pedro (CERN) ; Denz, Reiner (CERN) ; Ferrari, Alfredo (CERN) ; Foro, Lionel L (CERN) ; Peronnard, Paul (CERN) ; Røed, Ketil (U. Oslo (main)) et al.
The radiation environment encountered at high-energy hadron accelerators strongly differs from the environment relevant for space applications. The mixed-field expected at modern accelerators is composed of charged and neutral hadrons (protons, pions, kaons and neutrons), photons, electrons, positrons and muons, ranging from very low (thermal) energies up to the TeV range. [...]
2017 - 11 p. - Published in : Semicond. Sci. Technol. 32 (2017) 034003 External links: Fulltext; Fulltext; Fulltext; Fulltext
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6.
First irradiation test results of the ALICE SAMPA ASIC / Mahmood, Sohail Musa (U. Oslo (main) ; U. Sao Paulo (main)) ; Røed, Ketil (U. Oslo (main)) ; Winje, Fredrik Lindseth (U. Oslo (main)) ; Velure, Arild (U. Bergen (main)) /ALICE
With the continuous scaling of the CMOS technology, the CMOS circuits are considered to be more tolerant to Single event Latchup (SEL) effects due to the reduction in the supply voltages. This paper reports the results from SEL testing performed on the first two prototypes for the new readout ASIC (SAMPA). [...]
SISSA, 2018 - 5 p. - Published in : PoS TWEPP-17 (2018) 093 Fulltext: PDF; External link: PoS server
In : Topical Workshop on Electronics for Particle Physics, Santa Cruz, Ca, United States Of America, 11 - 15 Sep 2017, pp.093
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7.
SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate / García Alía, Rubén (CERN) ; Blackmore, Ewart W (TRIUMF) ; Brugger, Markus (CERN) ; Danzeca, Salvatore (CERN) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Gaillard, Rémi (Unlisted, FR) ; Mekki, Julien (CERN) ; Poivey, Christian (ESTEC, Noordwijk) ; Røed, Ketil (U. Oslo (main)) ; Saigné, Frédéric (CEM2, Montpellier) et al.
We use a single event latchup (SEL) model calibrated to heavy ion (HI) and proton data below 230 MeV to extrapolate the proton cross section to larger energies and evaluate the impact of the potential cross section increase with energy on the SEL rate in different environments. We show that in the case of devices with a large LET onset for HI and a certain amount of tungsten near the sensitive volume (SV), the calculated failure rates for energetic environments based on monoenergetic test data can significantly underestimate the real value. [...]
2014 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 61 (2014) 2936-2944
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8.
Irradiation tests of the complete ALICE TPC Front-End Electronics chain / Røed, Ketil ; Alme, J ; Campagnolo, R ; Gutíerrez, C G ; Helstrup, H ; Larsen, D ; Lindenstruth, V ; Musa, L ; Olsen, E ; Pokofiev, A et al.
CERN, 2005 Published version from CERN: PDF; External link: Fulltext
In : 11th Workshop on Electronics for LHC and Future Experiments, Heidelberg, Germany, 12 - 16 Sep 2005, pp.165-169 (CERN-2005-011)
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