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Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Distributions of the number of reconstructed jets after the fit to the data in the $\PW\PW$ SR (upper left), same-sign CR (upper right), $\PZ\to\PGt\PGt$ CR (center left), one \PQb tag CR (center right), and two \PQb tags CR (lower left), and the number of events in the $\WZ\to3\Pell\PGn$ and $\PZ\PZ\to4\Pell$ CRs (lower right). The histograms for $\tVx$ backgrounds include the contributions from $\ttbar\PV(\PV)$ processes. The histograms for $\PV\PGg$ backgrounds include the contributions from $\PW\PGg$ and $\PZ\PGg$ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The grey bands represent the uncertainties in the predicted yields. The vertical bars represent the statistical uncertainties in the data.
Results obtained in this analysis and other \WW production cross section measurements at different center-of-mass energies for the CMS~\cite{Chatrchyan:2013yaa, Khachatryan:2015sga, CMS:2020mxy}, ATLAS~\cite{ATLAS:2012mec, Aad:2016wpd, Aaboud:2017qkn}, CDF~\cite{Aaltonen:2016pos}, and D0~\cite{Abazov:2011cb} Collaborations are presented, and compared with the NNLO QCD $\times$ NLO EW and NLO predictions from \MATRIX. The vertical error bars represent the uncertainty in the measured cross section.
The upper panel shows the normalized cross section measurement for events with $\NJ=0$, 1, ${\ge}2$ jets. The filled circles represent the unfolded data results. The black, blue, and red lines represent the predictions from {\POWHEG}+\PYTHIA, \MATRIX, and \pminnlo+\PYTHIA, respectively. The lower panels show the ratio of the theoretical predictions to the measurement. In all panels, the error bars on the data points represent the total uncertainty in the measurement, and the shaded band depicts the uncertainty in the prediction.