| Diagram of the experimental area, not to scale. |
| Difference in position of hits along the $x$ (left) and $y$ (right) directions for the two wire chambers. The distributions contain an offset correction calculated assuming that the muons travel along straight trajectories. |
| Difference in position of hits along the $x$ (left) and $y$ (right) directions for the two wire chambers. The distributions contain an offset correction calculated assuming that the muons travel along straight trajectories. |
| Overview of the data path at the H2 test beam facility at CERN. |
| Schematic drawing of the $\sigma$ (left) and finger (center) tiles and a sectional view of the groove within which the WLS fiber is installed. |
| Schematic drawing of the $\sigma$ (left) and finger (center) tiles and a sectional view of the groove within which the WLS fiber is installed. |
| Schematic drawing of the $\sigma$ (left) and finger (center) tiles and a sectional view of the groove within which the WLS fiber is installed. |
| Average integrated SiPM charge in 25\unit{ns} time slices for $\sigma$ tiles (left) and finger tiles (right) in a muon beam. |
| Average integrated SiPM charge in 25\unit{ns} time slices for $\sigma$ tiles (left) and finger tiles (right) in a muon beam. |
| Maps of 2D efficiency for EJ-260 (left) and the second SCSN-81 finger tile (right). The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. Similar maps have been produced for the other scintillator samples. |
| Maps of 2D efficiency for EJ-260 (left) and the second SCSN-81 finger tile (right). The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. Similar maps have been produced for the other scintillator samples. |
| Event-by-event measurement of pedestal integrated charge, normalized to a single time slice. The distributions follow two distinct trends, which correspond to different SiPM arrays to which the scintillator tiles are connected. |
| Integrated charge spectra for the $\sigma$ tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the $\sigma$ tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the $\sigma$ tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the $\sigma$ tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the finger tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the finger tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the finger tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Integrated charge spectra for the finger tiles studied. The dashed lines indicate the threshold, set at 25\unit{fC}, above which a hit is considered to correspond to a MIP (muon). |
| Efficiency maps for the $\sigma$ tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the $\sigma$ tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the $\sigma$ tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the $\sigma$ tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the finger tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the finger tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the finger tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| Efficiency maps for the finger tiles studied. The dashed lines indicate the fiducial region that corresponds approximately to the overlap between the tile area and the beam, positioned along a path in which the hit efficiency, determined from the ratio of hits with an integrated pulse $>25\unit{fC}$, divided by all the hits in the same bin, is $>50\%$. |
| $x$ (left) and $y$ (right) efficiencies for $\sigma$ tiles (top) and finger tiles (bottom). |
| $x$ (left) and $y$ (right) efficiencies for $\sigma$ tiles (top) and finger tiles (bottom). |
| $x$ (left) and $y$ (right) efficiencies for $\sigma$ tiles (top) and finger tiles (bottom). |
| $x$ (left) and $y$ (right) efficiencies for $\sigma$ tiles (top) and finger tiles (bottom). |
| Example of multi-Gaussian fits to the charge spectra for the EJ-200 tile (upper), and the first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scales. The colored Gaussians represent the fitted results; the vertical lines indicate the Gaussian functions included in the calculation of the estimator of the average number of photoelectrons. |
| Example of multi-Gaussian fits to the charge spectra for the EJ-200 tile (upper), and the first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scales. The colored Gaussians represent the fitted results; the vertical lines indicate the Gaussian functions included in the calculation of the estimator of the average number of photoelectrons. |
| Example of multi-Gaussian fits to the charge spectra for the EJ-200 tile (upper), and the first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scales. The colored Gaussians represent the fitted results; the vertical lines indicate the Gaussian functions included in the calculation of the estimator of the average number of photoelectrons. |
| Example of multi-Gaussian fits to the charge spectra for the EJ-200 tile (upper), and the first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scales. The colored Gaussians represent the fitted results; the vertical lines indicate the Gaussian functions included in the calculation of the estimator of the average number of photoelectrons. |
| Example of functional-form fits to charge spectra for the EJ-260 2P tile (upper), and first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scale. The fit parameters are reported in the linear-scale plot: $\mu$ is the average number of photons initiating the Geiger discharge in the SiPM; $\chi$ the probability of cross-talk; $d_{\mathrm{inter-peak}}$ is the separation between neighboring peaks; pedestal indicates the location of the pedestal peak (it is consistent with zero, suggesting that the pedestal subtraction was correctly implemented); $\sigma_0$ and $\sigma_1$ are used to parameterize the width of the Gaussian peaks as follows: $\sigma_i^2 = \sigma_0^2+i\sigma_1^2$. |
| Example of functional-form fits to charge spectra for the EJ-260 2P tile (upper), and first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scale. The fit parameters are reported in the linear-scale plot: $\mu$ is the average number of photons initiating the Geiger discharge in the SiPM; $\chi$ the probability of cross-talk; $d_{\mathrm{inter-peak}}$ is the separation between neighboring peaks; pedestal indicates the location of the pedestal peak (it is consistent with zero, suggesting that the pedestal subtraction was correctly implemented); $\sigma_0$ and $\sigma_1$ are used to parameterize the width of the Gaussian peaks as follows: $\sigma_i^2 = \sigma_0^2+i\sigma_1^2$. |
| Example of functional-form fits to charge spectra for the EJ-260 2P tile (upper), and first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scale. The fit parameters are reported in the linear-scale plot: $\mu$ is the average number of photons initiating the Geiger discharge in the SiPM; $\chi$ the probability of cross-talk; $d_{\mathrm{inter-peak}}$ is the separation between neighboring peaks; pedestal indicates the location of the pedestal peak (it is consistent with zero, suggesting that the pedestal subtraction was correctly implemented); $\sigma_0$ and $\sigma_1$ are used to parameterize the width of the Gaussian peaks as follows: $\sigma_i^2 = \sigma_0^2+i\sigma_1^2$. |
| Example of functional-form fits to charge spectra for the EJ-260 2P tile (upper), and first SCSN-81 finger tile (lower), using linear (left) and logarithmic (right) scale. The fit parameters are reported in the linear-scale plot: $\mu$ is the average number of photons initiating the Geiger discharge in the SiPM; $\chi$ the probability of cross-talk; $d_{\mathrm{inter-peak}}$ is the separation between neighboring peaks; pedestal indicates the location of the pedestal peak (it is consistent with zero, suggesting that the pedestal subtraction was correctly implemented); $\sigma_0$ and $\sigma_1$ are used to parameterize the width of the Gaussian peaks as follows: $\sigma_i^2 = \sigma_0^2+i\sigma_1^2$. |