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Published Articles
Title Prediction of charge collection efficiency in hadron-irradiated pad and pixel silicon detectors
Author(s) Klingenberg, R (Dortmund U.) ; Krasel, O (Dortmund U.) ; Mass, M (Dortmund U.) ; Dobos, D (Dortmund U.) ; Gossling, C (Dortmund U.) ; Wunstorf, R (Dortmund U.)
Publication 2006
Imprint 2006
Number of pages 7
In: Nucl. Instrum. Methods Phys. Res., A 568 (2006) pp.34-40
In: 10th European Symposium on Semiconductor Detectors (formerly 'Elmau Conference'), Wildbad Kreuth, Germany, 12 - 16 Jun 2005, pp.34-40
DOI 10.1016/j.nima.2006.05.273
Subject category Detectors and Experimental Techniques
Accelerator/Facility, Experiment RD50
CERN LHC ; ATLAS
Abstract The Transient Current Technique (TCT) is used to measure pulse shapes of charge collection and to derive trapping times in irradiated silicon pad detectors in a fluence range up to $10^{15} \ n_{\rm{eq}} \rm{cm}^{-2}$. Simulations of electrical fields and charge collection mechanisms compared to the measurements of the TCT method allow to derive predictions of the charge collection efficiency. Independently, charge collection efficiencies have been determined in dedicated test beam data employing ATLAS pixel modules. Considering the geometry of pad and pixel structures the simulation for the tested fluence range can be verified and allows to extrapolate to larger fluences. This yields a useful input for the design of future silicon-based pixel detectors applicable in Super-LHC experiments.

Corresponding record in: Inspire


 Record creato 2018-08-22, modificato l'ultima volta il 2018-08-24