Author(s)
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Zyabkin, Dmitry (Department of Materials for Electronics, Institute of Materials Science and Engineering, TU Ilmenau, Gustav-Kirchhoff-Strasse 5, 98693 Ilmenau, Germany) ; Schell, Juliana (EP Department, ISOLDE-CERN, CH-1211 Geneva 23, Switzerland, Institute for Materials Science and Centre for Nanointegration, Duisburg-Essen CENIDE), University of Duisburg-Essen, 45141 Essen, Germany) ; Lupascu, Doru C (Institute for Materials Science and Centre for Nanointegration, Duisburg-Essen CENIDE), University of Duisburg-Essen, 45141 Essen, Germany) ; Pall Gunnlaugson, Haraldur (Science Institute, University of Iceland, Dunhaga) ; Masenda, Hilary (School of Physics, University of the Witwatersrand, Johannesburg, 2050, South Africa) ; Mantovan, Roberto (Laboratorio MDM, IMM-CNR, Via Olivetti 2, 20864, Agrate Brianza (MB), Italy) ; Baruth Ram, Krish (Durban University of Technology, Durban, 4000, South Africa, School of Chemistry and Physics, University of KwaZulu-Natal, Durban, 4000, South Africa) ; Ólafsson, Sveinn (Science Institute University of Iceland) ; P Gíslason, Hafliði (Science Institute University of Iceland) ; Qi, Bing Cui (Science Institute University of Iceland) ; Rkastev, Petko (Institute for Nuclear Research and Nuclear Energy, Bulgarian Academy of Sciences, 72, Tsarigradsko Chaussee Boulevard, Sofia, 1784, Bulgaria) ; Martins Correia, Joao Guilherme (EP Department, ISOLDE-CERN, CH-1211 Geneva 23, Switzerland, Centro de Ciências e Tecnologias Nucleares (CCTN), Instituto Superior Técnico, Universidade de Lisboa, Portugal) ; Vetter, Ulrich (Department of Materials for Electronics, Institute of Materials Science and Engineering, TU Ilmenau, Gustav-Kirchhoff-Strasse 5, 98693 Ilmenau, Germany) ; Schaaf, Peter (Department of Materials for Electronics, Institute of Materials Science and Engineering, TU Ilmenau, Gustav-Kirchhoff-Strasse 5, 98693 Ilmenau, Germany) |