Author(s)
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Carbonari, Artur (Instituto de Pesquisas Energéticas e Nucleares, IPEN, São Paulo, SP, Brazil) ; dos Santos, Robinson (Instituto de Pesquisas Energéticas e Nucleares, IPEN, São Paulo, SP, Brazil) ; Saxena, Rajendra (Instituto de Pesquisas Energéticas e Nucleares. IPEN, São Paulo, SP, Brazil) ; Burimova, Anastasia (Instituto de Pesquisas Energéticas e Nucleares. IPEN, São Paulo, SP, Brazil) ; Bosch-Santos, Brianna (Instituto de Pesquisas Energéticas e Nucleares. IPEN, São Paulo, SP, Brazil) ; Pereira, Luciano (Instituto de Pesquisas Energéticas e Nucleares. IPEN, São Paulo, SP, Brazil) ; Cabrera-Pasca, Gabriel (Universidade Federal do Pará, Campus de Abaetetuba, Pará, Brazil) ; Freitas, Rafael (Instituto de Física da Universidade de São Paulo (IFUSP), São Paulo, SP, Brazil) ; Richard, Diego (Departamento de Física, Facultad de Ciencias Exactas, Universidad Nacional de La Plata, La Plata, Argentina) ; Schell, Juliana (EP Department, ISOLDE-CERN, CH-1211 Geneva 23, Switzerland and Institute for Materials Science and Center for Nanointegration, Duisburg-Essen (CENIDE), University of Duisburg-Essen, 45141 Essen, Germany) ; Correa, João (EP Department, ISOLDE-CERN, CH-1211 Geneva 23, Switzerland and Centro de Ciências e Tecnologias Nucleares (CCTN), Instituto Superior Técnico, Universidade de Lisboa, Portugal) ; Lupascu, Doru (Institute for Materials Science and Center for Nanointegration, Duisburg-Essen (CENIDE), University of Duisburg-Essen, 45141 Essen, Germany) ; Schaaf, Peter (Chair of Department of Materials for Electronics, Technische Universität Ilmenau, Institute of Materials Science and Engineering, Gustav-Kirchhoff-Straße 5, 98693 Ilmenau, Germany) |