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CERN Accelerating science

Published Articles
Title Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
Author(s) Rochepault, E (LBNL, Berkeley ; CERN) ; Arbelaez, D (LBNL, Berkeley) ; Pong, I (LBNL, Berkeley) ; Dietderich, D R (LBNL, Berkeley)
Publication 2015
Number of pages 5
In: IEEE Trans. Appl. Supercond. 25 (2015) 8800905
In: Applied Superconductivity Conference 2014, Charlotte, NC, USA, 10 - 15 Aug 2014, pp.8800905
DOI 10.1109/TASC.2014.2385471
Subject category Accelerators and Storage Rings
Abstract High-critical current density (J_c) Nb_3Sn wires such as restacked-rod process wires are used in Rutherford cables for high-field superconducting magnets. However, during cabling, the wires experience strong plastic strains, which break some superconducting sub-elements and can degrade the electromagnetic performances. The damage can be reduced by forming Cu-Sn phases in the sub-elements during an annealing process prior to cabling. We found experimentally that annealing plays a significant role in reducing damage. Furthermore, we used finite-element models to validate the observations on samples and quantify the impact of annealing on damage reduction.

Corresponding record in: Inspire


 Δημιουργία εγγραφής 2016-06-23, τελευταία τροποποίηση 2018-04-27