| Comparison of distributions in data (points) versus expectation (stacked histograms) for the $\ttbar$ selection (see text). The electron transverse energy ($\et$) in the electron channel is shown on the left, missing transverse momentum ($\met$) in the muon channel is shown on the right. \thisttbar \thisoverflow |
| Comparison of distributions in data (points) versus expectation (stacked histograms) for the $\ttbar$ selection (see text). The electron transverse energy ($\et$) in the electron channel is shown on the left, missing transverse momentum ($\met$) in the muon channel is shown on the right. \thisttbar \thisoverflow |
| Distributions for the $\ttg$ selection (see text). The photon candidate transverse momentum ($\et$) distribution in data (points) is compared to the expectation (stacked histograms) for the electron (left) and muon (right) channels. \thisttbarphoton \thiswhizardvsmcatnlo \thisttbarphotonsystematics \thisoverflow |
| Distributions for the $\ttg$ selection (see text). The photon candidate transverse momentum ($\et$) distribution in data (points) is compared to the expectation (stacked histograms) for the electron (left) and muon (right) channels. \thisttbarphoton \thiswhizardvsmcatnlo \thisttbarphotonsystematics \thisoverflow |
| Comparison of the nominal prompt-photon track-isolation ($\ptcone$) template with the template obtained from data using a \ZeejetsPar\ selection, and with the template obtained from $\ttg$ simulation. The distributions show the probability $P(\ptcone | \gamma)$ of observing a photon in a given $\ptcone$ bin per GeV. The last bin contains any overflow. |
| A comparison of data-driven $T_{\text{bkg}}^\text{data}$ and simulation-based $T_{j\gamma}^{\text{MC}}$ track-isolation background templates is shown in the upper panel. The distributions show the probability $P(\ptcone | \gamma)$ of observing a photon in a given \ptcone\ bin per GeV. The ratio of the two templates is shown in the lower panel. The hatched band shows the total uncertainty. The last bin contains any overflow. |
| Track-isolation background template distribution after maximization of the likelihood $L_f$ defined in Eq.~\ref{eq:likelihood_fakescont} (top) and normalized residuals (bottom). The markers correspond to the nominal hadron background template. The stacked filled histograms represent the fraction of prompt photons in the hadron-fake control region (obtained as $f\times T_\text{sig}^{\text{data}}$) and the fraction of hadron-fakes (obtained from the simulation-based template as $(1-f)\times T_{jj}^{\text{MC}}$) as given by the fit. The normalized residuals, shown in the bottom plot, are defined as the difference between the `Nominal template' and the sum of $ (1-f)\times T_{jj}^{\text{MC}}$ and $f\times T_\text{sig}^{\text{data}}$, divided by the total uncertainty $\sigma_\theta$. The last bin contains any overflow. |
| Results of the combined likelihood fit using the track-isolation (\ptcone) distributions as the discriminating variable for the electron (left) and muon (right) channels. The contribution from $\ttg$ events is labeled as `Signal', prompt-photon background is labeled `$\gamma$ backgrounds', the contribution from hadrons misidentified as photons (as estimated by the template fit) is labeled as `Hadron fakes'. |
| Results of the combined likelihood fit using the track-isolation (\ptcone) distributions as the discriminating variable for the electron (left) and muon (right) channels. The contribution from $\ttg$ events is labeled as `Signal', prompt-photon background is labeled `$\gamma$ backgrounds', the contribution from hadrons misidentified as photons (as estimated by the template fit) is labeled as `Hadron fakes'. |
| Negative logarithm of the profile likelihood as a function of the \ttg\ fiducial cross section $\sttgfid\times \text{BR}$ with (solid line) and without (dashed line) free nuisance parameters associated with the systematic uncertainties. \thisdottedlinerules |