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Multiplicity of reconstructed vertices for \Zee\ candidate events. The grey error band displays the systematic uncertainty of the simulation, and is dominated by the uncertainty in the total inelastic pp scattering cross section measurement~\cite{Antchev:1495764,CMS-PAS-LUM-13-001}.

Dilepton invariant mass distributions in events passing the $\Zmm$ (left) and $\Zee$ (right) selections. The VV contribution corresponds to processes with two electroweak bosons produced in the final state. The top contribution corresponds to the top pair and single top production processes. The grey error band displays the systematic uncertainty of the simulation, due to the muon (left), or electron (right) energy scale.

Dilepton invariant mass distributions in events passing the $\Zmm$ (left) and $\Zee$ (right) selections. The VV contribution corresponds to processes with two electroweak bosons produced in the final state. The top contribution corresponds to the top pair and single top production processes. The grey error band displays the systematic uncertainty of the simulation, due to the muon (left), or electron (right) energy scale.

Distributions of $\Z/\gamma$ transverse momentum \qt in $\Zmm$ (left), $\Zee$ (right), and direct-photon events (bottom). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains overflow content. The VV contribution corresponds to processes with two electroweak bosons produced in the final state. The top contribution corresponds to the top pair and single top production processes. The EWK contribution corresponds to the $\Z\gamma$ and $\W\gamma$ production processes as well as $\W\rightarrow\text{e}\nu$ events.

Distributions of $\Z/\gamma$ transverse momentum \qt in $\Zmm$ (left), $\Zee$ (right), and direct-photon events (bottom). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains overflow content. The VV contribution corresponds to processes with two electroweak bosons produced in the final state. The top contribution corresponds to the top pair and single top production processes. The EWK contribution corresponds to the $\Z\gamma$ and $\W\gamma$ production processes as well as $\W\rightarrow\text{e}\nu$ events.

Distributions of $\Z/\gamma$ transverse momentum \qt in $\Zmm$ (left), $\Zee$ (right), and direct-photon events (bottom). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains overflow content. The VV contribution corresponds to processes with two electroweak bosons produced in the final state. The top contribution corresponds to the top pair and single top production processes. The EWK contribution corresponds to the $\Z\gamma$ and $\W\gamma$ production processes as well as $\W\rightarrow\text{e}\nu$ events.

The \pfvecmet distributions for events passing the dijet selection without cleaning algorithms applied (open markers), with cleaning algorithms applied including the one based on jet identification requirements (filled markers), and simulated events (filled histograms).

The \pfvecmet distribution in $\Zmm$ (left), $\Zee$ (middle), and direct-photon events (right). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

The \pfvecmet distribution in $\Zmm$ (left), $\Zee$ (middle), and direct-photon events (right). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

The \pfvecmet distribution in $\Zmm$ (left), $\Zee$ (middle), and direct-photon events (right). The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

Illustration of $Z\to\ell^+\ell^-$ (left) and direct-photon (right) event kinematics in the transverse plane. The vector \vut denotes the vectorial sum of the transverse momentum of all particles reconstructed in the event except for the two leptons from the \Z{} decay (left) or the photon (right).

Illustration of $Z\to\ell^+\ell^-$ (left) and direct-photon (right) event kinematics in the transverse plane. The vector \vut denotes the vectorial sum of the transverse momentum of all particles reconstructed in the event except for the two leptons from the \Z{} decay (left) or the photon (right).

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Distributions of \uperp (top) and \redupara (bottom) for \pfvecmet for \Zmm\ (left), \Zee\ (middle), and direct-photon events (right); The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Response curves for \pfvecmet in events with a \Z{}-boson or direct photon. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame shows the response in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty. The \qt value for each point is determined based on the average \qt value in data contributing to each point.

Resolution curves of the parallel recoil component (left) and perpendicular recoil component (right) versus \Z{}/$\gamma$ \qt for \pfvecmet in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty. The \qt value for each point is determined based on the average \qt value in data contributing to each point.

Resolution curves of the parallel recoil component (left) and perpendicular recoil component (right) versus \Z{}/$\gamma$ \qt for \pfvecmet in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty. The \qt value for each point is determined based on the average \qt value in data contributing to each point.

Resolution of the \pfvecmet projection along the $x$-axis (left) and the $y$-axis (right) as a function of \pfsumet in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the \pfvecmet projection along the $x$-axis (left) and the $y$-axis (right) as a function of \pfsumet in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Parallel (left) and perpendicular (right) recoil component resolution curves versus the number of reconstructed vertices for \pfvecmet\ in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Parallel (left) and perpendicular (right) recoil component resolution curves versus the number of reconstructed vertices for \pfvecmet\ in events with a \Z{}-boson or $\gamma$. Results are shown for $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Calo \met (left), and its parallel (middle) and perpendicular (right) recoil component spectra for \Zmm events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Calo \met (left), and its parallel (middle) and perpendicular (right) recoil component spectra for \Zmm events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Calo \met (left), and its parallel (middle) and perpendicular (right) recoil component spectra for \Zmm events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The first (last) bin contains the underflow (overflow) content.

Resolution curves of the parallel (left) and perpendicular (right) recoil component versus the number of reconstructed vertices for Calo~\met (green downward-triangle) and \pfvecmet (black upward-triangle) for \Zmm events. The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation.

Resolution curves of the parallel (left) and perpendicular (right) recoil component versus the number of reconstructed vertices for Calo~\met (green downward-triangle) and \pfvecmet (black upward-triangle) for \Zmm events. The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation.

No--PU \pfvecmet distributions in \Zmm\ (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

No--PU \pfvecmet distributions in \Zmm\ (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

No--PU \pfvecmet distributions in \Zmm\ (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA Unity \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA Unity \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

MVA Unity \pfvecmet distributions in \Zmm (left), \Zee\ (middle), and \GJ\ (right) events. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

Response curves for MVA Unity \pfvecmet (left top), MVA \pfvecmet (right top), and No--PU \pfvecmet (bottom), in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the response in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Response curves for MVA Unity \pfvecmet (left top), MVA \pfvecmet (right top), and No--PU \pfvecmet (bottom), in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the response in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Response curves for MVA Unity \pfvecmet (left top), MVA \pfvecmet (right top), and No--PU \pfvecmet (bottom), in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the response in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the No-PU \pfvecmet\ in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the No-PU \pfvecmet\ in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the MVA \pfvecmet in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the MVA \pfvecmet in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the MVA Unity \pfvecmet in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Resolution of the parallel (left) and perpendicular (right) recoil component as a function of $\qt$ for the MVA Unity \pfvecmet in $\Zmm$ events (full blue circles), $\Zee$ events (open red circles), and direct-photon events (full green squares). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation with the grey error band displaying the systematic uncertainty of the simulation, estimated as the maximum of each channel systematic uncertainty.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Parallel (top) and perpendicular (bottom) recoil component resolution as a function of the number of reconstructed vertices for \pfvecmet (black triangles), No-PU \pfvecmet (red squares), MVA \pfvecmet (blue open circles),and MVA Unity \pfvecmet (violet full circles) in \Zmm\ (left), \Zee\ (middle), and \GJ\ events (right). The upper frame of each figure shows the resolution in data; the lower frame shows the ratio of data to simulation. The \cPZ\ and direct-photon sample curves differ as the photon events are required to satisfy $\qt > 100\GeV$.

Distribution of \vecmet significance in the (left) \Zmm\ and (right) dijet samples. The red straight line corresponds to a $\chi^2$ distribution of 2 degrees of freedom; the white hatched region shows the distribution of events containing genuine non-zero \met. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

Distribution of \vecmet significance in the (left) \Zmm\ and (right) dijet samples. The red straight line corresponds to a $\chi^2$ distribution of 2 degrees of freedom; the white hatched region shows the distribution of events containing genuine non-zero \met. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation. The last bin contains the overflow content.

Distribution of \pchisq\ in the (left) \Zmm\ and (right) dijet samples. Events that contain a source of genuine \vecmet are represented by the hatched white region. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation.

Distribution of \pchisq\ in the (left) \Zmm\ and (right) dijet samples. Events that contain a source of genuine \vecmet are represented by the hatched white region. The points in the lower panel of each plot show the data/MC ratio, including the statistical uncertainties of both data and simulation; the grey error band displays the systematic uncertainty of the simulation.

Distribution of \vecmet significance in the (left) \Wenu\ and (right) \ttbar\ events. The last bin contains the overflow content.

Distribution of \vecmet significance in the (left) \Wenu\ and (right) \ttbar\ events. The last bin contains the overflow content.

Distribution of \pchisq\ in the (left) \Wenu\ and (right) \ttbar\ events. The insets show the same data as the main plots, but with a log scale to show the background components more clearly.

Distribution of \pchisq\ in the (left) \Wenu\ and (right) \ttbar\ events. The insets show the same data as the main plots, but with a log scale to show the background components more clearly.

Signal versus background efficiencies for \Wenu\ for various \met-based discriminating variables. The FFT Significance variable (green dashed line) is discussed in Section~\ref{s:nongaussian}.

The average \vecmet significance versus the number of reconstructed vertices for (left) dijet and (right) \Wenu\ event samples.

The average \vecmet significance versus the number of reconstructed vertices for (left) dijet and (right) \Wenu\ event samples.

Efficiency curves for \vecmet significance in \Wenu\ channel in three regions defined by the number of reconstructed vertices. The signal versus background efficiencies are shown in the left pane. In the right pane, the signal (right) and background (left) efficiencies are shown separately as a function of the threshold on \sig.

Efficiency curves for \vecmet significance in \Wenu\ channel in three regions defined by the number of reconstructed vertices. The signal versus background efficiencies are shown in the left pane. In the right pane, the signal (right) and background (left) efficiencies are shown separately as a function of the threshold on \sig.

Comparisons in dijet events of the FFT (non-Gaussian) and analytic (Gaussian) methods for calculating \vecmet significance. Left: \vecmet significance distribution. Right: \pchisq\ distribution. For this figure, both the FFT (red triangles) and analytic (black histogram) algorithms are applied only to data. The analogous MC distributions for the analytic method are shown in Figs.~\ref{fig:zeromet_sig}~and~\ref{fig:zeromet_pchi2}. Non-Gaussian significance values of $\mathcal{S}\gtrsim 80$ are suppressed due to the finite number of significant figures available to double precision variables used in the FFT algorithm. The last bin contains the overflow content.

Comparisons in dijet events of the FFT (non-Gaussian) and analytic (Gaussian) methods for calculating \vecmet significance. Left: \vecmet significance distribution. Right: \pchisq\ distribution. For this figure, both the FFT (red triangles) and analytic (black histogram) algorithms are applied only to data. The analogous MC distributions for the analytic method are shown in Figs.~\ref{fig:zeromet_sig}~and~\ref{fig:zeromet_pchi2}. Non-Gaussian significance values of $\mathcal{S}\gtrsim 80$ are suppressed due to the finite number of significant figures available to double precision variables used in the FFT algorithm. The last bin contains the overflow content.