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The distribution of the invariant mass $m_{\mathrm{J_3 J_4}}$ of the two additional light jets in the $\ttbar$ control region (\cmsLeft). The $\pt$ distribution of the highest-$\pt$ jet, $p_{\mathrm{T},\mathrm{J_1}}$, in the signal region (\cmsRight). Signal and background yields are taken from the maximum-likelihood fit to CMS data described in the text. The uncertainty band corresponds to the total uncertainty on the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the invariant mass $m_{\mathrm{J_3 J_4}}$ of the two additional light jets in the $\ttbar$ control region (\cmsLeft). The $\pt$ distribution of the highest-$\pt$ jet, $p_{\mathrm{T},\mathrm{J_1}}$, in the signal region (\cmsRight). Signal and background yields are taken from the maximum-likelihood fit to CMS data described in the text. The uncertainty band corresponds to the total uncertainty on the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the sum of the masses reconstructed from all the particles originating at the SVs, $m_{\mathrm{SV},\,\mathrm{J_1}}+m_{\mathrm{SV},\,\mathrm{J_2}}$, (\cmsLeft) and the distribution for the variable $H_{\mathrm{T}}$ (\cmsRight) in the alternative looser b-tag selection. These two distributions are the projections of the two-dimensional fit performed as a cross-check and described in the text. Signal and background yields correspond to the post-fit results. The uncertainty band corresponds to the total uncertainty in the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the sum of the masses reconstructed from all the particles originating at the SVs, $m_{\mathrm{SV},\,\mathrm{J_1}}+m_{\mathrm{SV},\,\mathrm{J_2}}$, (\cmsLeft) and the distribution for the variable $H_{\mathrm{T}}$ (\cmsRight) in the alternative looser b-tag selection. These two distributions are the projections of the two-dimensional fit performed as a cross-check and described in the text. Signal and background yields correspond to the post-fit results. The uncertainty band corresponds to the total uncertainty in the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the angular distance $\Delta R$ between the two selected b jets (\cmsLeft) and the distribution of the transverse mass $\MT$ of the muon-$\VEtmiss$ system (\cmsRight). Signal and background yields are taken from the binned maximum-likelihood fit described in the text. The uncertainty band corresponds to the uncertainty in the yields as given by the fit. The last bin in both plots includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the angular distance $\Delta R$ between the two selected b jets (\cmsLeft) and the distribution of the transverse mass $\MT$ of the muon-$\VEtmiss$ system (\cmsRight). Signal and background yields are taken from the binned maximum-likelihood fit described in the text. The uncertainty band corresponds to the uncertainty in the yields as given by the fit. The last bin in both plots includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the invariant mass $m_{\mathrm{J_{1} J_{2}}}$ of the two selected b jets (\cmsLeft) and the distribution of the transverse momentum of the dijet system, ${\pt}_{,\,\mathrm{J_{1} J_{2}}}$ (\cmsRight). Signal and background yields are taken from the binned maximum-likelihood fit described in the text. The uncertainty band corresponds to the total uncertainty in the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.
The distribution of the invariant mass $m_{\mathrm{J_{1} J_{2}}}$ of the two selected b jets (\cmsLeft) and the distribution of the transverse momentum of the dijet system, ${\pt}_{,\,\mathrm{J_{1} J_{2}}}$ (\cmsRight). Signal and background yields are taken from the binned maximum-likelihood fit described in the text. The uncertainty band corresponds to the total uncertainty in the fitted yields. The last bin in both figures includes overflow events. The lower panels show the ratio of observed data events to the total fitted yield.