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CERN Accelerating science

 
(top row) The number of Pixel (left) and SCT (right) hits on tracks for data (points with errors) and MC (histogram) for two different centrality bins: 0-10\% (open/dotted) and 40-80\% (closed/solid). (bottom row) The average number of Pixel (left) and SCT (right) hits as a function of $\eta$ for MC and data in the same two centrality bins.
(top row) The number of Pixel (left) and SCT (right) hits on tracks for data (points with errors) and MC (histogram) for two different centrality bins: 0-10\% (open/dotted) and 40-80\% (closed/solid). (bottom row) The average number of Pixel (left) and SCT (right) hits as a function of $\eta$ for MC and data in the same two centrality bins.
(top row) The number of Pixel (left) and SCT (right) hits on tracks for data (points with errors) and MC (histogram) for two different centrality bins: 0-10\% (open/dotted) and 40-80\% (closed/solid). (bottom row) The average number of Pixel (left) and SCT (right) hits as a function of $\eta$ for MC and data in the same two centrality bins.
(top row) The number of Pixel (left) and SCT (right) hits on tracks for data (points with errors) and MC (histogram) for two different centrality bins: 0-10\% (open/dotted) and 40-80\% (closed/solid). (bottom row) The average number of Pixel (left) and SCT (right) hits as a function of $\eta$ for MC and data in the same two centrality bins.
Oppositely-charged di--muon invariant mass spectra in the four considered centrality bins from most peripheral (40-80\%) to most central (0-10\%). The $J/\psi$ yields in each centrality bin are obtained using a sideband technique. The fits shown here are used as a cross check.
Oppositely-charged di--muon invariant mass spectra in the four considered centrality bins from most peripheral (40-80\%) to most central (0-10\%). The $J/\psi$ yields in each centrality bin are obtained using a sideband technique. The fits shown here are used as a cross check.
Oppositely-charged di--muon invariant mass spectra in the four considered centrality bins from most peripheral (40-80\%) to most central (0-10\%). The $J/\psi$ yields in each centrality bin are obtained using a sideband technique. The fits shown here are used as a cross check.
Oppositely-charged di--muon invariant mass spectra in the four considered centrality bins from most peripheral (40-80\%) to most central (0-10\%). The $J/\psi$ yields in each centrality bin are obtained using a sideband technique. The fits shown here are used as a cross check.
noimg: The measured numbers of $J/\psi$ signal events per centrality bin before any correction, with their statistical errors, are listed in the second column. The relative efficiency corrections derived from the simulation are also shown, with the MC statistical error. The last columns give the experimental systematic uncertainties on the reconstruction efficiency and signal extraction, as well as the total uncertainty.: The correction factors $R_{\mathrm{coll}}$, together with the relative systematic uncertainty, stated as a 1$\sigma$ value.
(left) Relative $J/\psi$ yield as a function of centrality normalized to the most peripheral bin (black dots with errors). The expected relative yields from the (normalized) number of binary collisions ($R_{\mathrm{coll}}$) are also shown (boxes, reflecting 1$\sigma$ systematic uncertainties). (right) Value of $R_{cp}$, as described in the text, as a function of centrality. The statistical errors are shown as vertical bars while the grey boxes also include the combined systematic errors. The darker box indicates that the 40-80\% bin is used to set the scale for all bins, but the uncertainties in this bin are not propagated into the more central ones.
(left) Relative $J/\psi$ yield as a function of centrality normalized to the most peripheral bin (black dots with errors). The expected relative yields from the (normalized) number of binary collisions ($R_{\mathrm{coll}}$) are also shown (boxes, reflecting 1$\sigma$ systematic uncertainties). (right) Value of $R_{cp}$, as described in the text, as a function of centrality. The statistical errors are shown as vertical bars while the grey boxes also include the combined systematic errors. The darker box indicates that the 40-80\% bin is used to set the scale for all bins, but the uncertainties in this bin are not propagated into the more central ones.
The di--muon invariant mass (left) after the selection described in the text. The value of $R_{cp}$ (right) computed with the 38 selected $Z$ candidates. The statistical errors are shown as vertical bars while the grey boxes also include the combined systematic errors. The darker box indicates that the 40-80\% bin is used to set the scale for all bins, but the uncertainties in this bin are not propagated into the more central ones.
The di--muon invariant mass (left) after the selection described in the text. The value of $R_{cp}$ (right) computed with the 38 selected $Z$ candidates. The statistical errors are shown as vertical bars while the grey boxes also include the combined systematic errors. The darker box indicates that the 40-80\% bin is used to set the scale for all bins, but the uncertainties in this bin are not propagated into the more central ones.