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Author(s)
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Schwering, G (RWTH, Aachen, Germany) ; Fopp, St (RWTH, Aachen, Germany) ; Karpinski, W (RWTH, Aachen, Germany) ; Kirn, T (Aachen, Germany) ; Lübelsmeyer, K (RWTH, Aachen, Germany) ; Orboeck, J (RWTH, Aachen, Germany) ; Schael, S (RWTH, Aachen, Germany) ; Schultz, A (RWTH, Aachen, Germany) ; Dratzig, V (RWTH, Aachen, Germany) ; Siedenburg, T (RWTH, Aachen, Germany) ; Sielding, R (RWTH, Aachen, Germany) ; Wallraf, W (RWTH, Aachen, Germany) ; Becker, U (Massachussets Inst. of Technol., Cambridge, USA) ; Bürger, J (Massachussets Inst. of Technol., Cambridge, USA) ; Capell, M (Massachussets Inst. of Technol., Cambridge, USA) ; Corosi, G P (Massachussets Inst. of Technol., Cambridge, USA) ; Demirkoz, B (Massachussets Inst. of Technol., Cambridge, USA) ; Fisher, P (Massachussets Inst. of Technol., Cambridge, USA) ; Henning, R E (Massachussets Inst. of Technol., Cambridge, USA) ; Koutsenko, V F (Massachussets Inst. of Technol., Cambridge, USA) ; Kunin, A (Massachussets Inst. of Technol., Cambridge, USA) ; Monreal, B (Massachussets Inst. of Technol., Cambridge, USA) ; Scholberg, K (Massachussets Inst. of Technol., Cambridge, USA) |